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Roman V. Kruzelecky

Publications -  71
Citations -  909

Roman V. Kruzelecky is an academic researcher. The author has contributed to research in topics: Spectrometer & Thermal emittance. The author has an hindex of 12, co-authored 67 publications receiving 790 citations.

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Effects of Ti–W codoping on the optical and electrical switching of vanadium dioxide thin films grown by a reactive pulsed laser deposition

TL;DR: In this paper, the effect of W and Ti dopant effects on the semiconductor-to-metal phase transition of VO2 were investigated by measuring the temperature dependence of their electrical resistivity and their infrared transmittance.
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Thermochromic VO2 film deposited on Al with tunable thermal emissivity for space applications

TL;DR: In this article, the emissivity properties of the system VO2/substrate strongly depend on the IR optical properties of a substrate, such as Al, and the transition from an insulator or semiconductor state to a metallic state.
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Optical switching of vanadium dioxide thin films deposited by reactive pulsed laser deposition

TL;DR: In this paper, the parameters of reactive pulsed laser deposition were successfully optimized for fabrication of vanadium dioxide thin films, and the structural properties of the deposited films were analyzed by x-ray diffraction, while their semiconductor-to-metal phase transitions were studied by electrical resistivity using the four-point technique and infrared transmittance from room temperature up to 100'°C.
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Spectral reflectance properties of minerals exposed to simulated Mars surface conditions

TL;DR: The spectral changes were often accompanied by visible color changes, suggesting that subsurface sulfates exposed to the martian surface environment may undergo measurable changes in reflectance spectra and color over short periods of time as mentioned in this paper.
Proceedings ArticleDOI

In-plane silicon-on-insulator optical MEMS accelerometer using waveguide fabry-perot microcavity with silicon/air bragg mirrors

TL;DR: In this paper, a novel in-plane Silicon-On-insulator (SOI) optical accelerometer using a Fabry-Perot microcavity with two distributed Bragg reflectors (DBR) is presented, in which one DBR mirror is attached to two suspended proof masses.