R
Ruxu Du
Researcher at South China University of Technology
Publications - 344
Citations - 5492
Ruxu Du is an academic researcher from South China University of Technology. The author has contributed to research in topics: Mechanical watch & Sheet metal. The author has an hindex of 34, co-authored 336 publications receiving 4683 citations. Previous affiliations of Ruxu Du include University of Miami & University of Windsor.
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Nano- and microsize effect of CCTO fillers on the dielectric behavior of CCTO/PVDF composites
TL;DR: In this article, the microstructure and dielectric properties of composites comprising polyvinylidene fluoride (PVDF) and calcium copper titanate (CCTO) particles have been investigated.
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Model-based Fault Detection and Diagnosis of HVAC systems using Support Vector Machine method
TL;DR: A new method by combining the model-based FDD method and the Support Vector Machine (SVM) method can help to maintain the health of the HVAC systems, reduce energy consumption and maintenance cost.
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Fault diagnosis using support vector machine with an application in sheet metal stamping operations
TL;DR: A new method for fault diagnosis using a newly developed method, support vector machine (SVM), which is very effective and requires only few training samples, which is an attractive feature for shop floor applications.
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An investigation of ultrasonic-assisted electrical discharge machining in gas
TL;DR: In this paper, an ultrasonic-assisted electrical discharge machining (UEDM) method was proposed to improve the efficiency of electrical discharge cutting in gas medium. But, the workpiece material is AISI 1045 steel and the electrode material is copper.
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Size-controlled preparation of silver nanoparticles by a modified polyol method
TL;DR: In this article, size-controlled silver nanoparticles were prepared with liquid phase chemical method in the ethylene glycol/polyvinylpyrrolidone media by means of X-ray diffraction (XRD), transmission electron microscopy (TEM), Fourier transform infrared (FT-IR), thermal analysis (TA), and Xray photoelectron spectroscopy (XPS).