scispace - formally typeset
S

Saibal Mukhopadhyay

Researcher at Georgia Institute of Technology

Publications -  432
Citations -  10232

Saibal Mukhopadhyay is an academic researcher from Georgia Institute of Technology. The author has contributed to research in topics: Computer science & CMOS. The author has an hindex of 40, co-authored 381 publications receiving 8814 citations. Previous affiliations of Saibal Mukhopadhyay include IBM & Purdue University.

Papers
More filters
Proceedings ArticleDOI

Multi-Physics Driven Co-Design of 3D Multicore Architectures

TL;DR: This paper proposes an adaptive architecture that accommodates the thermal coupling between layers and leads to increased energy efficiency over a wider operating voltage range and therefore higher performance and proposes a novel adaptive cache structure — the constant performance model (CPM) cache — based on voltage adaptations to temperature variations.
Proceedings ArticleDOI

Closed-loop Approach to Perception in Autonomous System

TL;DR: In this article, a focus-of-attention based feedback from end-task such as motion planning is used to control computation within the deep neural networks (DNNs) used in early perception tasks such as object detection.
Proceedings ArticleDOI

Clock data compensation aware clock tree synthesis in digital circuits with adaptive clock generation

TL;DR: The paper shows the delay sensitivity mismatch between clock tree and critical path can degrade CDC effect by analyzing timing slack under power supply noise (PSN), and proposes simple but efficient clock tree synthesis (CTS) technique to maximize timing slackunder PSN in digital circuits with adaptive clock generation.
Proceedings ArticleDOI

Experimental characterization of in-package microfluidic cooling on a System-on-Chip

TL;DR: The measurements demonstrated that the in-package fluidic cooling improves the SoC's energy-efficiency and reduces design footprint compared to the external passive cooling.
Proceedings ArticleDOI

On the Effect of NBTI Induced Aging of Power Stage on the Transient Performance of On-Chip Voltage Regulators

TL;DR: The measurement results from 130nm CMOS test-chips demonstrate that an IVR exhibits a higher tolerance to power stage aging compared to DLDO, indicating degradation of transient performance of on-chip voltage regulators.