S
Saibal Mukhopadhyay
Researcher at Georgia Institute of Technology
Publications - 432
Citations - 10232
Saibal Mukhopadhyay is an academic researcher from Georgia Institute of Technology. The author has contributed to research in topics: Computer science & CMOS. The author has an hindex of 40, co-authored 381 publications receiving 8814 citations. Previous affiliations of Saibal Mukhopadhyay include IBM & Purdue University.
Papers
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Proceedings ArticleDOI
NeuroSensor: A 3D image sensor with integrated neural accelerator
Mohammad Faisal Amir,Duckhwan Kim,Jaeha Kung,D. Lie,Sudhakar Yalamanchili,Saibal Mukhopadhyay +5 more
TL;DR: The physical design of NeuroSensor is presented, a 3D CIS with an integrated convolutional neural network (CNN) accelerator that will effectively harness the inherent parallelism in neural algorithms for intelligent vision processing.
Journal ArticleDOI
Thermal Investigation Into Power Multiplexing for Homogeneous Many-Core Processors
TL;DR: For a given migration frequency, global coolest replace policy is found to be the most effective among the three policies considered as this policy provides 10 °C reduction in peak temperature and 20 °C reduce in maximum spatial temperature difference on a 256 core chip.
Proceedings ArticleDOI
Adaptive Control of Camera Modality with Deep Neural Network-Based Feedback for Efficient Object Tracking
TL;DR: Mixed-modality image enables object tracking with a single deep neural network as opposed to the decision- level fusion with two separate networks for visual image and infrared image while operating at 2X frame-rate and consuming 50% less energy.
Proceedings ArticleDOI
Enhancement in CMOS chip performance through microfluidic cooling
TL;DR: In this paper, the authors present experimental results of a working CMOS chip capable of generating controllable heat and on-chip temperature sensing under air cooling and microfluidic cooling.
Proceedings ArticleDOI
Characterization of Inverse Temperature Dependence in logic circuits
Minki Cho,Muhammad M. Khellah,Kwanyeob Chae,Khondker Zakir Ahmed,James W. Tschanz,Saibal Mukhopadhyay +5 more
TL;DR: Measurements from a 130nm test-chip show that the Zero-Temperature-Coefficient (ZTC) point varies by circuit type, and further fluctuates due to process variation, and a more accurate ITD-sensitive thermal sensor is thus needed for better temperature tracking.