S
Saibal Mukhopadhyay
Researcher at Georgia Institute of Technology
Publications - 432
Citations - 10232
Saibal Mukhopadhyay is an academic researcher from Georgia Institute of Technology. The author has contributed to research in topics: Computer science & CMOS. The author has an hindex of 40, co-authored 381 publications receiving 8814 citations. Previous affiliations of Saibal Mukhopadhyay include IBM & Purdue University.
Papers
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Proceedings ArticleDOI
On improving the algorithmic robustness of a low-power FIR filter
TL;DR: This work designs a FIR filter by using a simple feedback based approach to reduce the memory errors and a linear predictor structure for correcting the logic errors and shows a considerable improvement in the output Signal to Noise ratio.
Proceedings ArticleDOI
Reliable Edge Intelligence in Unreliable Environment
Minah Lee,Xueyuan She,Biswadeep Chakraborty,Saurabh Dash,Burhan Ahmad Mudassar,Saibal Mukhopadhyay +5 more
TL;DR: In this article, the authors present a broad perspective on how to design AI platforms to ensure reliable performance even in unreliable environments and discuss the concept of using lightweight networks as reliability estimators to generate early warning of potential task failures.
Journal ArticleDOI
Novel lipid biomarkers and associated gene polymorphism in young ST-segment elevation myocardial infarction
Ghazi Muheeb,Mohit Gupta,Shekhar Kunal,Deepak Basia,Girish Mp,Ankit Bansal,Jamal Yusuf,Saibal Mukhopadhyay,Sanjay Tyagi,Ritu Singh +9 more
TL;DR: In this article , the role of novel lipid biomarkers and their genetic polymorphisms in young (<50 years) ST-segment elevation myocardial infarction (STEMI) patients was investigated.
Proceedings ArticleDOI
Aging Challenges in On-chip Voltage Regulator Design
Venkata Chaitanya Krishna Chekuri,Arvind Singh,Nael Mizanur Rahman,Edward Lee,Saibal Mukhopadhyay +4 more
TL;DR: The measurement results indicate upto 25% improvement in response time for aging induced degradations using an auto-tuning algorithm, demonstrating that an IVR exhibits a higher tolerance to power stage aging compared to DLDO.
Proceedings ArticleDOI
On the parametric failures of SRAM in a 3D-die stack considering tier-to-tier supply cross-talk
TL;DR: This paper analyzes the supply crosstalk between logic cores and SRAMs on separate tiers in a 3D die-stack using a distributed RLC based 3D power grid model and shows that due to the supply cross-talk power variation in cores modulates the performances and parametric failures in SRAM.