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Satoshi Nagai

Researcher at Toshiba

Publications -  113
Citations -  911

Satoshi Nagai is an academic researcher from Toshiba. The author has contributed to research in topics: Ultrasonic sensor & Signal. The author has an hindex of 15, co-authored 113 publications receiving 891 citations.

Papers
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Patent

Ultrasonic flaw detection method and equipment thereof

TL;DR: In this article, the authors used an acoustic couplant agent to change the shape of a probe by injecting the couplant into the case of a vibrator and using an arm to incline the probe from the inside to the outside of the case.
Patent

Method and device for determining deterioration of coating material

TL;DR: In this article, an ultrasonic wave was emitted toward a coating layer to detect energy change based on a received wave from the coating layer, so as to exactly determine a degree of deterioration of a coating material based on the energy change.
Proceedings ArticleDOI

Design of resist stacks with antireflection coatings from the viewpoint of focus budget

TL;DR: In this article, the BFD induced by resist stack was studied through simulation and experiment by decomposing it into the following three components: One induced by the "refraction" effect, one induced by ''reflection'' effect, and one inducing by ''process'' effect.
Patent

Ultrasonic probe and ultrasonic flaw detector

TL;DR: In this paper, the authors proposed an ultrasonic probe to detect flaws along the depth of a hole in a construction with a hole by deflecting and focusing the ultrasonic beam transmitted from a vibrator and received by a regular hexagon-shaped probe.