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Satoshi Nagai

Researcher at Toshiba

Publications -  113
Citations -  911

Satoshi Nagai is an academic researcher from Toshiba. The author has contributed to research in topics: Ultrasonic sensor & Signal. The author has an hindex of 15, co-authored 113 publications receiving 891 citations.

Papers
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Patent

Ultrasonic wave flaw detector

TL;DR: In this article, an array type probe 1 is brought into contact with the surface of a body to be inspected, and the data at that part are collected and recorded as the flaw detection data.
Patent

Overlay control method and a semiconductor manufacturing method and apparatus employing the same

TL;DR: In this paper, enhanced overlay control mechanisms are provided to enable previous layers to perform corrections to an extent that does not exceed a correction ability of a next layer, so that the previous layer can perform corrections without exceeding the tolerate range.
Journal ArticleDOI

Improved ultrasonic testing by phased array technique and its application

TL;DR: In this article, two examples of phased array application were conducted in order to establish the availability of this technique as an actual NDT technique, and it was recognized that both types of scanning mode had the capability for defect detection and successful estimation of the defect size.
Patent

Ultrasonic flaw detector and ultrasonic flaw detecting method

TL;DR: An ultrasonic flaw detector including an ultrasonic probe and a drive element control unit for controlling a plurality of ultrasonic elements to emit a reflected ultrasonic wave from an object is described in this paper.
Patent

Ultrasonic flaw detecting apparatus

TL;DR: In this paper, a transversal wave oblique angle probe is arranged on the surface of an aluminum wedge as a transmitting probe so as to be positioned directly above a part where the fatigue crack generated at the shoulder corner part of a wedge is detected.