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Satoshi Nagai
Researcher at Toshiba
Publications - Â 113
Citations - Â 911
Satoshi Nagai is an academic researcher from Toshiba. The author has contributed to research in topics: Ultrasonic sensor & Signal. The author has an hindex of 15, co-authored 113 publications receiving 891 citations.
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Patent
Electronic scanning type ultrasonic non-destructive testing apparatus
TL;DR: In this paper, an ultrasonic non-destructive testing apparatus of the electronic scanning type comprising transmitter for producing exciting pulses in response to a predetermined timing pulse, a probe coupled to said transmitter, having a plurality of transducers for transmitting ultrasonic waves into a body to be tested and for receiving ultrasonic echo waves, signal processor coupled to the probe for processing the received by said probe to generate an echo wave signal, a memory coupled to a signal processor for storing reference data on an amplitude attenuation of an ultrasound echo coming through each beam propagating path which is obtained by
Patent
Phased array ultrasonic testing apparatus and testing method therefor
TL;DR: A phased array ultrasonic testing apparatus includes an array probe for ultrasonic transmission and reception, a transmitter for sequentially exciting transducers of the probe in a predetermined order, and a circuit for preparing a composite signal from reception output from the probe; and a signal indicating an internal flaw of a tested body in synchronism with the composite signal in accordance with a transmission beam index point and a steered angle of an ultrasonic main beam as discussed by the authors.
Journal ArticleDOI
Remote field eddy current testing for steam generator inspection of fast reactor
TL;DR: In this article, the authors confirmed the defect detection performance of the remote field eddy current testing (RFECT) in order to inspect the helical-coil-type double wall tube steam generator with the wire mesh layer for the new small fast reactor 4S (Super-Safe, Small and Simple).
Patent
Plant maintenanace method and apparatus
Kazunari Fujiyama,Toshihiro Fujiwara,Kazuhiro Saito,Taiji Hirasawa,Satoshi Nagai,Hitoshi Kichise,Mitsuyoshi Okazaki,Hirotsugu Kodama,Seiichi Asatsu,Masanori Minowa,Takayuki Iwahashi,Shigeru Harada,Mamoru Sudo,Fumiharu Ishii +13 more
TL;DR: In this paper, a failure event tree breakdown is performed on failures to be expected for the equipment and preventive maintenance expenses are calculated for preventing failure events, where the failure tree is calculated based on failure unreliability function and a cost of recovery from each failure event is calculated.
Proceedings ArticleDOI
Insertion strategy for EUV lithography
Obert Wood,John C. Arnold,Timothy A. Brunner,Martin Burkhardt,Chen Jim C,Deniz E. Civay,S. Fan,Emily Gallagher,Scott Halle,Ming He,Craig Higgins,Hirokazu Kato,Jongwook Kye,Chiew-seng Koay,Guillaume Landie,Pak Leung,Gregory McIntyre,Satoshi Nagai,Karen Petrillo,Sudhar Raghunathan,Ralph Schlief,Lei Sun,Alfred Wagner,Tom Wallow,Yunpeng Yin,Xuelian Zhu,Matthew E. Colburn,Daniel Corliss,Cecilia C. Smolinski +28 more
TL;DR: The first use of extreme ultraviolet (EUV) lithography in logic manufacturing is targeted for the 14 nm node, with a possible earlier application to 20-nm node logic device back-end layers to demonstrate the technology as mentioned in this paper.