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Satoshi Nagai

Researcher at Toshiba

Publications -  113
Citations -  911

Satoshi Nagai is an academic researcher from Toshiba. The author has contributed to research in topics: Ultrasonic sensor & Signal. The author has an hindex of 15, co-authored 113 publications receiving 891 citations.

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Patent

Plant equipment design support device

TL;DR: In this paper, a plant equipment design support system is provided with a design request input means 1 for plant-constituting equipment, a design parameter setting means 2, a failure probability database 4, an event simulation means 3, a risk cost computing means 5, a conformability determination means 6, a parameter alteration means 7, and a design instruction means 8 when the design conformity determination determines that a request is not satisfied, selects the optimum design parameter conforming to the design conditions in the conformity determination, and outputs the optimal design conditions based on the result of the selection.
Patent

Array type probe

TL;DR: In this paper, an array type probe is constituted from N numbers of ultrasonic vibrator sets 2(1)-2(N) arranged in parallel relation to each other and the aforementioned each sets are respectively constituted from M numbers of vibrators 3(1-3(M).
Patent

Lithography tool alignment control system

TL;DR: In this paper, a set of alignment marks can be selected to create overlay correction parameters to realign the wafer, which can be used to determine which alignment marks have poor reproducibility and can create an unstable offset.
Patent

Photomask unit, exposing method and method for manufacturing semiconductor device

TL;DR: In this article, a pellicle is configured so that transmittance of incident light of an incident angle θ (0°<θ<90°) is higher than transmittances of incident lognormal light of a incident angle 0°.
Patent

Ultrasonic flaw detection device for different-material welding rotor

TL;DR: In this article, the authors proposed a method to prevent the deterioration of accuracy and reliability of ultrasonic flaw detection without requiring the scanning of the ultrasonic probes in the horizontal direction.