scispace - formally typeset
S

Satwik Patnaik

Researcher at Texas A&M University

Publications -  86
Citations -  897

Satwik Patnaik is an academic researcher from Texas A&M University. The author has contributed to research in topics: Computer science & Injection locking. The author has an hindex of 15, co-authored 68 publications receiving 564 citations. Previous affiliations of Satwik Patnaik include New York University & New York University Abu Dhabi.

Papers
More filters
Journal ArticleDOI

Obfuscating the interconnects: low-cost and resilient full-chip layout camouflaging

TL;DR: This work proposes a novel LC scheme which is low-cost and generic — full-chip LC can finally be realized without any reservation and makes the flow publicly available, enabling the community to protect their sensitive designs.
Journal ArticleDOI

Multi-Beam Spatio-Spectral Beamforming Receiver for Wideband Phased Arrays

TL;DR: This paper reports the first analog integrated spatio-spectral beamforming front-end that allows for accurate beam steering of signals with large fractional bandwidths, thus minimizing beam squinting, and simultaneous and independent steering of multi-carrier signals.
Proceedings ArticleDOI

Advancing hardware security using polymorphic and stochastic spin-hall effect devices

TL;DR: In this article, the giant spin-Hall effect (GSHE) switch was used to hide Boolean satisfiability (SAT) attacks in a single instance of a single-input single-output (SIMO) circuit.
Proceedings ArticleDOI

Understanding the Transient Behavior of Injection Locked LC Oscillators

TL;DR: An analytical framework has been developed to describe the transient behavior of negative resistance injection-locked oscillators based on Adler's equation and it has been shown that injection locking can be used to meet the requirements for fast hopping systems like the MBOA-UWB specification.
Proceedings ArticleDOI

Rethinking split manufacturing: an information-theoretic approach with secure layout techniques

TL;DR: This work presents two practical layout techniques towards secure split manufacturing: gate-level graph coloring and clustering of same-type gates and provides — for the first time — a theoretical framework for quantifying the layout-level resilience against any proximity-induced information leakage.