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Stefan Vogt

Researcher at Argonne National Laboratory

Publications -  284
Citations -  12362

Stefan Vogt is an academic researcher from Argonne National Laboratory. The author has contributed to research in topics: Microscopy & Beamline. The author has an hindex of 58, co-authored 278 publications receiving 10920 citations. Previous affiliations of Stefan Vogt include Loyola University Medical Center & Northwestern University.

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Journal ArticleDOI

Biological applications of X-ray microprobes.

TL;DR: An overview of the workshop on X-ray fluorescence microscopy is presented and use of XFM in biomedical sciences is growing and may be advanced even further by adding high resolution microprobes and high throughput approaches to the XFM toolbox.
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Direct Determination of the Intracellular Oxidation State of Plutonium

TL;DR: Microprobe X-ray absorption near edge structure measurements were used to determine directly, for the first time, the oxidation state of intracellular plutonium in individual 0.1-μm(2) areas within single rat pheochromocytoma cells (PC12).
Proceedings ArticleDOI

Opportunities and limitations for combined fly-scan ptychography and fluorescence microscopy

TL;DR: The opportunities and limitations of making use of additional information provided by ptychography to improve x-ray fluorescence images in two ways are discussed: by using position-error-correction algorithms to correct for scan distortions in fluorescence scans, and by considering the signal-to-noise limits on previously-demonstrated ptyChographic probe deconvolution methods.
Journal ArticleDOI

Measurement of moisture-dependent ion diffusion constants in wood cell wall layers using time-lapse micro X-ray fluorescence microscopy

TL;DR: Researchers can now utilize polymer science approaches to engineer the molecular architecture of lignocellulosic biomass to optimize properties for specific end uses, which contradicts previous assertions that intra-cell-wall diffusion is an aqueous process occurring through water pathways.
Journal ArticleDOI

Increased Throughput and Sensitivity of Synchrotron-Based Characterization for Photovoltaic Materials

TL;DR: In this article, the authors implemented on-the-fly data collection (flyscan) at Beamline 2-ID-D at the Advanced Photon Source at Argonne National Laboratory, eliminating a 300ms per-pixel overhead time.