S
Steve Hall
Researcher at University of Liverpool
Publications - 237
Citations - 2674
Steve Hall is an academic researcher from University of Liverpool. The author has contributed to research in topics: Dielectric & High-κ dielectric. The author has an hindex of 25, co-authored 235 publications receiving 2465 citations. Previous affiliations of Steve Hall include University of Southampton.
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Journal ArticleDOI
Navigation aids in the search for future high-k dielectrics: Physical and electrical trends
Olof Engström,Bahman Raeissi,Steve Hall,Octavian Buiu,Max C. Lemme,Heiner Gottlob,Paul K. Hurley,Karim Cherkaoui +7 more
TL;DR: In this article, empirical relations for k-values and energy band offset values for gate dielectric materials are presented, which can be used in the search for gate-dielectric material fulfilling the needs of future CMOS generations.
Navigation aids in the search for future high-k dielectrics: physical and electrical trends
Olof Engström,Bahman Raeissi,Steve Hall,Octavian Buiu,Max C. Lemme,Heiner Gottlob,Paul K. Hurley,Karim Cherkaoui +7 more
TL;DR: In this article, empirical relations for k-values and energy band offset values for gate dielectric materials are presented, which can be used in the search for gate-dielectric material fulfilling the needs of future CMOS generations.
Journal ArticleDOI
Physical origin of negative differential resistance in SOI transistors
TL;DR: In this article, it was shown that a significant increase in temperature occurs in the channel of SOI transistors due to the relatively poor thermal conductivity of the buried insulator.
Journal ArticleDOI
Dispersion relation data for methylammonium lead triiodide perovskite deposited on a (100) silicon wafer using a two-step vapour-phase reaction process
Laurie J. Phillips,Atef M. Rashed,Robert E. Treharne,James Kay,Peter J. Yates,Ivona Z. Mitrovic,Ayendra Weerakkody,Steve Hall,Ken Durose +8 more
TL;DR: Ellipsometry was used to measure the amplitude ratio and phase difference of light undergoing a phase shift as it interacts with a thin film of organic–inorganic hybrid perovskite CH3NH3PbI3 deposited onto a silicon wafer.
Journal ArticleDOI
Maximizing the optical performance of planar CH3NH3PbI3 hybrid perovskite heterojunction stacks
Laurie J. Phillips,Atef M. Rashed,Robert E. Treharne,James Kay,Peter J. Yates,Ivona Z. Mitrovic,Ayendra Weerakkody,Steve Hall,Ken Durose +8 more
TL;DR: In this paper, a vapour-phase reaction process has been used to deposit smooth and uniform CH 3 NH 3 PbI 3 perovskite material to enable the measurement of its optical dispersion relations, n and k, by ellipsometry.