S
Sumeet S. Aphale
Researcher at University of Aberdeen
Publications - 99
Citations - 2068
Sumeet S. Aphale is an academic researcher from University of Aberdeen. The author has contributed to research in topics: Control theory & Computer science. The author has an hindex of 16, co-authored 85 publications receiving 1741 citations. Previous affiliations of Sumeet S. Aphale include Newcastle University & University of Newcastle.
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Design, Identification, and Control of a Flexure-Based XY Stage for Fast Nanoscale Positioning
TL;DR: In this article, a flexure-based, piezoelectric stack-actuated XY nanopositioning stage was designed to combine the ability to scan over a relatively large range (25times25 mum) with high scanning speed.
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Integral resonant control of collocated smart structures
TL;DR: In this article, the authors introduce integral resonant control (IRC), a simple, robust and well-performing technique for vibration control in smart structures with collocated sensors and actuators.
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A New Method for Robust Damping and Tracking Control of Scanning Probe Microscope Positioning Stages
TL;DR: In this article, a simple second-order controller that eliminates scan-induced oscillation and provides integral tracking action is demonstrated to improve the tracking bandwidth of an NT-MDT scanning probe microscope from 15 Hz to 490 Hz while simultaneously improving gain margin from 2 to 7 dB.
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Integral Resonant Control for Vibration Damping and Precise Tip-Positioning of a Single-Link Flexible Manipulator
TL;DR: In this article, the authors proposed a control design method for single-link flexible manipulators based on the integral resonant control (IRC) scheme, which is a high-performance controller design methodology for flexible structures with collocated actuator-sensor pairs.
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Minimizing Scanning Errors in Piezoelectric Stack-Actuated Nanopositioning Platforms
TL;DR: In this article, the authors compared three commonly used damping controllers, positive position feedback, polynomial-based pole placement, and resonant control for nanopositioning applications.