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Victoria Chen

Researcher at Stanford University

Publications -  20
Citations -  929

Victoria Chen is an academic researcher from Stanford University. The author has contributed to research in topics: Graphene & Chemical vapor deposition. The author has an hindex of 9, co-authored 18 publications receiving 480 citations. Previous affiliations of Victoria Chen include Pennsylvania State University.

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Electronic synapses made of layered two-dimensional materials

TL;DR: It is shown that multilayer hexagonal boron nitride (h-BN) can be used as a resistive switching medium to fabricate high-performance electronic synapses, enabling the emulation of a range of synaptic-like behaviour, including both short- and long-term plasticity.
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Ultrahigh thermal isolation across heterogeneously layered two-dimensional materials

TL;DR: These thermal metamaterials are an example in the emerging field of phononics and could find applications where ultrathin thermal insulation is desired, in thermal energy harvesting, or for routing heat in ultracompact geometries.
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High-performance flexible nanoscale transistors based on transition metal dichalcogenides

TL;DR: In this paper, the authors report flexible nanoscale FETs based on 2D semiconductors; these are fabricated by transferring chemical-vapour-deposited transition metal dichalcogenides from rigid growth substrates together with nano-patterned metal contacts, using a polyimide film, which becomes the flexible substrate after release.
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High-Performance Flexible Nanoscale Field-Effect Transistors Based on Transition Metal Dichalcogenides

TL;DR: In this paper, the authors demonstrate flexible monolayer MoS2 FETs with the shortest channels reported to date (down to 50 nm) and remarkably high on-current (up to 470 uA/um at 1 V drain-to-source voltage).
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Contact Engineering High-Performance n-Type MoTe2 Transistors.

TL;DR: Unipolar n-type MoTe2 transistors with the highest performance to date are demonstrated, including high saturation current and relatively low contact resistance and high resolution X-ray photoelectron spectroscopy reveals that interfacial metal-Te compounds dominate the contact resistance.