W
Wilhelm Warta
Researcher at Fraunhofer Society
Publications - 258
Citations - 21740
Wilhelm Warta is an academic researcher from Fraunhofer Society. The author has contributed to research in topics: Silicon & Carrier lifetime. The author has an hindex of 58, co-authored 258 publications receiving 20808 citations. Previous affiliations of Wilhelm Warta include University of Freiburg & University of Stuttgart.
Papers
More filters
Journal ArticleDOI
Quantitative Iron Concentration Imaging
TL;DR: In this paper, the influence of hydrogen passivation induced by silicon nitride passivation is estimated by comparison of silicon oxide and aluminum oxide passivation, and the second part of this work deals with systematic errors inherent to the iron concentration technique.
Proceedings ArticleDOI
Redistribution of Recombination Active Defects and Trapping Effects in Multicrystalline Silicon After Wet Thermal Oxidation
TL;DR: In this paper, the effect of a wet thermal oxidation step at 800 degC with fast temperature ramps on the effective lifetimes measured by the CDI and QSSPC methods was investigated.
Proceedings ArticleDOI
Determining the junction temperature for stc measurements of thin film solar cells
TL;DR: In this paper, the VOC-method was used to predict the spatial and temporal distributions of changes in the temperature of an encapsulated thin film layer, which is confirmed by experiments with specially prepared organic solar cells that also contained a temperature sensor.
Proceedings ArticleDOI
What photons tell us about solar cells – imaging diagnostic techniques
Martin Kasemann,Johannes Giesecke,Wolfram Kwapil,Bernhard Michl,Marco Seeland,Harald Hoppe,Wilhelm Warta +6 more
TL;DR: In this paper, the authors demonstrate that band-to-band luminance, heat radiation, dislocation luminescence, and junction-breakdown-related radiation can be used to measure and detect local series resistances, hot-spots, defect-induced junction breakdown, and bulk-, surface-and grain-boundary recombination in silicon solar cells.
Proceedings ArticleDOI
Comparison of spatially resolved carrier lifetimes in mc-Si with solar cell and material characteristics
TL;DR: In this paper, the authors introduced a novel application of modulated free carrier absorption (MFCA) for measuring minority carrier lifetimes in multicrystalline silicon with high spatial resolution.