W
Wilhelm Warta
Researcher at Fraunhofer Society
Publications - 258
Citations - 21740
Wilhelm Warta is an academic researcher from Fraunhofer Society. The author has contributed to research in topics: Silicon & Carrier lifetime. The author has an hindex of 58, co-authored 258 publications receiving 20808 citations. Previous affiliations of Wilhelm Warta include University of Freiburg & University of Stuttgart.
Papers
More filters
Journal ArticleDOI
Hot holes in naphthalene: High, electric-field-dependent mobilities
Wilhelm Warta,Norbert Karl +1 more
TL;DR: It will be shown that the low-temperature results can be understood in terms of a standard band-model description, whereas the continuation of the experimental temperature-dependence law (\ensuremath{\mu}\ensure Math{\propto}${T}^{n}$) (for both holes and electrons) into the high-tem temperature regime remains a problem for future theoretical work.
Journal ArticleDOI
Field-effect passivation of the SiO2Si interface
TL;DR: In this paper, the field effect passivation of the interface of thermal oxides on silicon is experimentally investigated by depositing corona charges on the oxide of solar cells and of lifetime test structures.
Journal ArticleDOI
Solar cell efficiency tables (version 35)
Book
Lock-in Thermography: Basics and Use for Evaluating Electronic Devices and Materials
TL;DR: Physical and technical basics, experimental technique, theory, measurement strategies, typical applications, summary and outlook as discussed by the authors, as well as more details about measurement strategies are discussed in Section 2.1.
Journal ArticleDOI
Spectral response measurements of monolithic GaInP/Ga(In)As/Ge triple-junction solar cells : measurement artifacts and their explanation
TL;DR: In this paper, a detailed procedure for the spectral response measurement of multi-junction cells is developed, specially designed to minimize such measurement artifacts, which occurs if the subcell under test has non-ideal properties, such as a low shunt resistance or a low reverse breakdown voltage.