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X. X. Xi
Researcher at Rutgers University
Publications - 17
Citations - 723
X. X. Xi is an academic researcher from Rutgers University. The author has contributed to research in topics: Thin film & Pulsed laser deposition. The author has an hindex of 9, co-authored 17 publications receiving 720 citations.
Papers
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Journal ArticleDOI
Interlayer coupling effect in high-Tc superconductors probed by YBa2Cu3O7-x/PrBa2Cu3O7-x superlattices.
Qi Li,X. X. Xi,X. D. Wu,A. Inam,S. Vadlamannati,W. L. McLean,Thirumalai Venkatesan,Ramamoorthy Ramesh,D. M. Hwang,J. A. Martinez,L. Nazar +10 more
TL;DR: The decrease of {ital T}{sub {ital c}} in isolated YBa{sub 2}Cu{sub 3}O{sub 7{minus}{ital x}} layers with increasing sheet resistance is on the same scale of about {h bar}/{ital e}{sup 2} as observed for ordinary superconductors.
Journal ArticleDOI
Structural perfection of Y‐Ba‐Cu‐O thin films controlled by the growth mechanism
Ramamoorthy Ramesh,C. C. Chang,T. S. Ravi,D. M. Hwang,A. Inam,X. X. Xi,Qi Li,X. D. Wu,T. Venkatesan +8 more
TL;DR: In this article, the authors reported the observation of YBa2Cu3O7−x(123) thin films having unprecedented structural perfection, at temperatures near 700°C on [001] LaAlO3.
Journal ArticleDOI
Fast bolometric response by high Tc detectors measured with subnanosecond synchrotron radiation
G. L. Carr,M. Quijada,David B. Tanner,Carol J. Hirschmugl,Gwyn P. Williams,Shahab Etemad,B. Dutta,F. DeRosa,A. Inam,T. Venkatesan,X. X. Xi +10 more
TL;DR: In this paper, the authors measured a fast response by thin-film YBa2Cu3O7−δ detectors to pulsed, broadband, infrared radiation and found no evidence for any non-bolometric components in the response.
Journal ArticleDOI
Large critical current densities in YBa2Cu3O7−x thin films made at high deposition rates
X. D. Wu,Ross E. Muenchausen,S. R. Foltyn,R. C. Estler,Robert C. Dye,A. R. Garcia,Nicholas S. Nogar,P. England,Ramamoorthy Ramesh,D. M. Hwang,T. S. Ravi,C. C. Chang,Thirumalai Venkatesan,X. X. Xi,Qi Li,A. Inam +15 more
TL;DR: In this article, critical current densities (Jc) in YBa2Cu3O7−x films made at deposition rates from 0.1 to 14.5 nm/s (∼50 μm/h) were measured using a direct transport method.
Journal ArticleDOI
The atomic structure of growth interfaces in Y-Ba-Cu-O thin films
R. Ramesh,A. Inam,D. M. Hwang,T. S. Ravi,Timothy D. Sands,X. X. Xi,X. D. Wu,Qi Li,T. Venkatesan,R. Kilaas +9 more
TL;DR: In this paper, the atomic structure of growth interfaces in thin films of Y-Ba-Cu-O grown on perovskite or cubic substrates was examined, and it was shown that defects on the substrate surface propagate as defects in the film.