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X. X. Xi

Researcher at Rutgers University

Publications -  17
Citations -  723

X. X. Xi is an academic researcher from Rutgers University. The author has contributed to research in topics: Thin film & Pulsed laser deposition. The author has an hindex of 9, co-authored 17 publications receiving 720 citations.

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Interlayer coupling effect in high-Tc superconductors probed by YBa2Cu3O7-x/PrBa2Cu3O7-x superlattices.

TL;DR: The decrease of {ital T}{sub {ital c}} in isolated YBa{sub 2}Cu{sub 3}O{sub 7{minus}{ital x}} layers with increasing sheet resistance is on the same scale of about {h bar}/{ital e}{sup 2} as observed for ordinary superconductors.
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Structural perfection of Y‐Ba‐Cu‐O thin films controlled by the growth mechanism

TL;DR: In this article, the authors reported the observation of YBa2Cu3O7−x(123) thin films having unprecedented structural perfection, at temperatures near 700°C on [001] LaAlO3.
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Fast bolometric response by high Tc detectors measured with subnanosecond synchrotron radiation

TL;DR: In this paper, the authors measured a fast response by thin-film YBa2Cu3O7−δ detectors to pulsed, broadband, infrared radiation and found no evidence for any non-bolometric components in the response.
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Large critical current densities in YBa2Cu3O7−x thin films made at high deposition rates

TL;DR: In this article, critical current densities (Jc) in YBa2Cu3O7−x films made at deposition rates from 0.1 to 14.5 nm/s (∼50 μm/h) were measured using a direct transport method.
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The atomic structure of growth interfaces in Y-Ba-Cu-O thin films

TL;DR: In this paper, the atomic structure of growth interfaces in thin films of Y-Ba-Cu-O grown on perovskite or cubic substrates was examined, and it was shown that defects on the substrate surface propagate as defects in the film.