A
A. Inam
Researcher at Telcordia Technologies
Publications - 25
Citations - 840
A. Inam is an academic researcher from Telcordia Technologies. The author has contributed to research in topics: Thin film & Layer (electronics). The author has an hindex of 14, co-authored 25 publications receiving 840 citations.
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Crystallographically Aligned Ferroelectric Films Usable in Memories and Method of Crystallographically Aligning Perovskite Films
A. Inam,Ramamoorthy Ramesh +1 more
TL;DR: In this article, the a-axis oriented perovskite thin films are grown on a silicon substrate with an intermediate buffer layer of yttria-stabilized zirconia.
Journal ArticleDOI
High critical currents in epitaxial YBa2Cu3O7−x thin films on silicon with buffer layers
X. D. Wu,A. Inam,M. S. Hegde,B. Wilkens,C. C. Chang,D. M. Hwang,L. Nazar,Thirumalai Venkatesan,Sadahiko Miura,Shogo Matsubara,Yoichi Miyasaka,Nobuaki Shohata +11 more
TL;DR: In this article, as-deposited superconducting thin films (∼0.1 μm) of YBa2Cu3O7−x have been prepared by pulsed laser deposition on (100) Si with buffer layers of BaTiO3/MgAl2O4.
Journal ArticleDOI
Substrate effects on the properties of Y‐Ba‐Cu‐O superconducting films prepared by laser deposition
T. Venkatesan,C. C. Chang,D. Dijkkamp,Satishchandra Ogale,E. W. Chase,L. A. Farrow,D. M. Hwang,P. F. Miceli,S. A. Schwarz,Jean-Marie Tarascon,X. D. Wu,A. Inam +11 more
TL;DR: In this paper, it was shown that the substrate lattice influences the film properties primarily in three ways: the thermal expansion mismatch introduces cracks in the film, the interface reaction changes the film composition, and the lattice lattice affects the crystallographic orientation of the film.
Journal ArticleDOI
Structural perfection of Y‐Ba‐Cu‐O thin films controlled by the growth mechanism
Ramamoorthy Ramesh,C. C. Chang,T. S. Ravi,D. M. Hwang,A. Inam,X. X. Xi,Qi Li,X. D. Wu,T. Venkatesan +8 more
TL;DR: In this article, the authors reported the observation of YBa2Cu3O7−x(123) thin films having unprecedented structural perfection, at temperatures near 700°C on [001] LaAlO3.
Journal ArticleDOI
Defect structure of laser deposited Y-Ba-Cu-O thin films on single crystal MgO substrate
R. Ramesh,D. M. Hwang,J. B. Barner,L. Nazar,T. S. Ravi,A. Inam,B. Dutta,X. D. Wu,Thirumalai Venkatesan +8 more
TL;DR: In this article, structural defects in thin films of nominal composition YBa2Cu3O7 (123) grown on single crystal MgO have been characterized, and the main types of stacking defects correspond to the cationic stoichiometries of “248, 247, and 224”.