scispace - formally typeset
Y

Y. Liu

Researcher at Nanyang Technological University

Publications -  36
Citations -  372

Y. Liu is an academic researcher from Nanyang Technological University. The author has contributed to research in topics: Thin film & Ion implantation. The author has an hindex of 10, co-authored 31 publications receiving 358 citations. Previous affiliations of Y. Liu include University of Electronic Science and Technology of China.

Papers
More filters
Journal ArticleDOI

Anomalous capacitance-voltage characteristics of Al/Al-rich Al2O3/p-Si capacitors and their reconstruction

TL;DR: In this paper, the anomalous capacitance-voltage (C-V) characteristics of Al/Al-rich Al2O3/p-Si capacitors have been observed.
Journal ArticleDOI

Influence of excess Si distribution in the gate oxide on the memory characteristics of MOSFETs

TL;DR: In this paper, the memory characteristics of the MOSFETs have been investigated for the following two excess Si distributions: (1) the excess Si is distributed in a narrow layer in the gate oxide near the Si substrate; and (2) the extra Si are distributed throughout the gate Oxide.
Journal ArticleDOI

Charge trapping phenomena of tetraethylorthosilicate thin film containing Si nanocrystals synthesized by solid-state reaction

TL;DR: It is demonstrated that charging and discharging mechanisms are due to the Si nc rather than the TEOS oxide defects, which provides the possibility of memory applications at low cost.
Journal ArticleDOI

Epilepsy detection with artificial neural network based on as-fabricated neuromorphic chip platform

TL;DR: A lightweight automatic epilepsy detection system with artificial neural network based on the authors' as-fabricated neuromorphic chip to achieve high-accuracy detection without the need for epilepsy-related prior knowledge is proposed.
Journal ArticleDOI

Conduction switching in aluminum nitride thin films containing Al nanocrystals

TL;DR: In this article, it is shown that the conduction switching is due to the charging and discharging in the nc-Al at certain strategic sites, and with the connecting (or breaking) of some conductive tunneling paths formed by the uncharged nc−Al due to discharging (or charging) in the Al at the strategic sites.