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Yingjie Ma
Researcher at Chinese Academy of Sciences
Publications - 54
Citations - 298
Yingjie Ma is an academic researcher from Chinese Academy of Sciences. The author has contributed to research in topics: Dark current & Photoluminescence. The author has an hindex of 8, co-authored 47 publications receiving 219 citations.
Papers
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Journal ArticleDOI
Bi2Te3 photoconductive detectors on Si
Juanjuan Liu,Yaoyao Li,Yuxin Song,Yingjie Ma,Qimiao Chen,Zhongyunshen Zhu,Zhongyunshen Zhu,Pengfei Lu,Shumin Wang,Shumin Wang +9 more
TL;DR: In this paper, a Si-based single-crystal bismuth telluride (Bi2Te3) photoconductive detector was used for photon detection of Si photonics.
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Nearly lattice-matched short-wave infrared InGaAsBi detectors on InP
TL;DR: In this article, a short-wave infrared detector nearly lattice matched to InP substrate using quaternary InGaAsBi as the absorption layer is presented, which shows promising potential of InP-based lattice-matched InGaAAsBi detectors for shortwave infrared detection.
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Dark current suppression in metamorphic In0.83Ga0.17As photodetectors with In0.66Ga0.34As/InAs superlattice electron barrier
TL;DR: In this article, the InP-based metamorphic In0.83Ga0.17As photodetectors with dramatically suppressed dark currents by inserting a strain-compensated In 0.34As/InAs superlattice electron barrier in the absorption layer were presented.
Journal ArticleDOI
Tailoring the performances of low operating voltage InAlAs/InGaAs avalanche photodetectors
TL;DR: The spectral responsivity of those APDs show anomalous negative temperature coefficients at gain factors larger than 1, which is attributed to the enhanced phonon scattering effect of carriers in the avalanche region at higher temperatures.
Journal ArticleDOI
Impact of etching on the surface leakage generation in mesa-type InGaAs/InAlAs avalanche photodetectors.
Yingjie Ma,Yonggang Zhang,Yi Gu,Xingyou Chen,Yanhui Shi,W.Y. Ji,S. P. Xi,Ben Du,Xiaoliang Li,Hengjing Tang,Yongfu Li,Jiaxiong Fang +11 more
TL;DR: Effects of mesa etching and geometry on InGaAs/InAlAs avalanche photodiodes (APDs) were investigated by using both wet and inductively coupled plasma (ICP) etching with different mesa shapes as well as etchants and it was found that the mesa geometry had no evident impact on APDs' characteristics regardless of the etching techniques applied.