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Yudi Zhao

Researcher at Peking University

Publications -  31
Citations -  413

Yudi Zhao is an academic researcher from Peking University. The author has contributed to research in topics: Resistive random-access memory & Neuromorphic engineering. The author has an hindex of 7, co-authored 28 publications receiving 265 citations. Previous affiliations of Yudi Zhao include Beijing Information Science & Technology University.

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Reconfigurable Nonvolatile Logic Operations in Resistance Switching Crossbar Array for Large-Scale Circuits.

TL;DR: Resistance switching devices have potential to offer computing and memory function and Resistance states stored in devices located in arbitrary positions of RS array can be performed various nonvolatile logic operations.
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Impacts of State Instability and Retention Failure of Filamentary Analog RRAM on the Performance of Deep Neural Network

TL;DR: With the optimization method, the robustness of the FA-RRAM-based DNN is enhanced significantly in which no accuracy loss is observed even after 107s, and the accuracy loss caused by state instability and retention failure is mitigated.
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Modeling and Optimization of Bilayered TaO x RRAM Based on Defect Evolution and Phase Transition Effects

TL;DR: In this article, a comprehensive physical model on the resistive switching behaviors of bilayered TaO x -based RS access memory [RRAM] is presented, and an atomistic Monte Carlo simulation method based on the model is developed to investigate the dynamic physical processes and reproduce the experimental phenomena.
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Improvement of State Stability in Multi-Level Resistive Random-Access Memory (RRAM) Array for Neuromorphic Computing

TL;DR: In this paper, a new operation scheme is developed to improve the state stability of multi-level resistive random-access memory (RRAM) array, which is mainly derived from the excessive oxygen vacancies generated by the abrupt SET process.
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Demonstration of Logic Operations in High-Performance RRAM Crossbar Array Fabricated by Atomic Layer Deposition Technique.

TL;DR: Based on the fabricated RRAM array, a complete set of basic logic operations including NOR and XNOR were successfully demonstrated and showed good uniformity and high reliability.