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Ze Zhu

Researcher at City University of Hong Kong

Publications -  14
Citations -  182

Ze Zhu is an academic researcher from City University of Hong Kong. The author has contributed to research in topics: Soldering & Microstructure. The author has an hindex of 5, co-authored 14 publications receiving 131 citations.

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Friction-stir welding of a ductile high entropy alloy: microstructural evolution and weld strength

TL;DR: In this paper, the microstructural evolution during FSW was dominated by discontinuous recrystallization through grain bulging and the B/B ¯ {112} shear texture formed in the stir zone (SZ).
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Effect of the size of carbon nanotubes (CNTs) on the microstructure and mechanical strength of CNTs-doped composite Sn0.3Ag0.7Cu-CNTs solder

TL;DR: Carbon nanotubes (CNTs) with three different diameter ranges (10-20, 40-60, and 60-100) were doped into tin-silver-copper (SAC) solder, to study the performance of the composite SAC-CNT materials.
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Failure mechanisms of solder interconnects under current stressing in advanced electronic packages: An update on the effect of alternating current (AC) stressing

TL;DR: The discrepancies of reported temperature distribution are explained and the possible reasons are analyzed and microstructure evolution of interfacial intermetallic compounds under both DC and AC stressing, as well as the effect of various frequency are discussed.
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Comparative study of the microstructure and mechanical strength of tin-copper (Sn0.7Cu) solder modified with silver (Ag) by both alloying and doping methods

TL;DR: In this article, the effectiveness of alloying methods with doping methods was compared in order to compare the microstructure and mechanical strength of Sn0.7Cu solders and two kinds of Ag modified solders.
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Effect of alternating current (AC) stressing on the microstructure and mechanical properties of low-silver content solder interconnect

TL;DR: In this paper, the effect of alternating current (AC) on the microstructure and mechanical properties of a line-type solder interconnect was designed for investigation of the impact of AC on the performance of the interconnect.