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Zhimin Hu

Researcher at China Academy of Engineering Physics

Publications -  51
Citations -  376

Zhimin Hu is an academic researcher from China Academy of Engineering Physics. The author has contributed to research in topics: Electron beam ion trap & Laser. The author has an hindex of 9, co-authored 45 publications receiving 312 citations. Previous affiliations of Zhimin Hu include Chinese Academy of Engineering & Chubu University.

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Experimental demonstration of the Breit interaction which dominates the angular distribution of x-ray emission in dielectronic recombination.

TL;DR: The authors' measurements agree well with the theoretical prediction and confirm the dominance of the Breit interaction in the angular distribution of the dielectronic recombination of Li-like Au.
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Polarization measurement of dielectronic recombination transitions in highly charged krypton ions

TL;DR: The linear polarization of x rays generated during a dielectronic recombination was measured in good agreement with theoretical predictions, leading to a refined technique to diagnose the electron currents and magnetic fields in both high-temperature astrophysical and laboratory plasmas as discussed by the authors.
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Linear polarization of x-ray transitions due to dielectronic recombination in highly charged ions

TL;DR: In this article, the linear polarization of x rays produced by dielectronic recombination into highly charged xenon ions was measured at an electron beam ion trap using the Compton polarimetry technique.
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Temperature dependent phonon evolutions and optical properties of highly c-axis oriented CuGaO 2 semiconductor films grown by the sol-gel method

TL;DR: In this article, a transparent conductive CuGaO2 oxide films were prepared on sapphire substrates by the sol-gel method and the highly c-axis orientation and optical transparency (60%-80%) in the visible region were obtained.
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Atomic-number dependence of the magnetic-sublevel population in the autoionization state formed in dielectronic recombination

TL;DR: In this article, the magnetic-sublevel population of the autoionization state formed in dielectronic recombination (DR) of highly charged heavy ions has been experimentally investigated by combining two types of measurements with an electron beam ion trap.