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Zi-Yi Wang

Researcher at Fudan University

Publications -  23
Citations -  887

Zi-Yi Wang is an academic researcher from Fudan University. The author has contributed to research in topics: Thin film & Dielectric. The author has an hindex of 12, co-authored 23 publications receiving 720 citations. Previous affiliations of Zi-Yi Wang include Chinese Ministry of Education & ULTra.

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Lead-Free Perovskite Nanowire Array Photodetectors with Drastically Improved Stability in Nanoengineering Templates

TL;DR: For the first time, three-dimensional CH3NH3SnI3 perovskite nanowire arrays were fabricated in nanoengineering templates, which can address Nanowire integration and stability issues at the same time, and it was discovered that as the nanowires are embedded in mechanically and chemically robust templates, the material decay process has been dramatically slowed down.
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All Inorganic Cesium Lead Iodide Perovskite Nanowires with Stabilized Cubic Phase at Room Temperature and Nanowire Array-Based Photodetectors.

TL;DR: It was discovered that the as-grown NWs have stable cubic phase at room temperature, which suggests a novel and practical approach to stabilize the cubic phase of CsPbI3 material, which will have broad applications for optoelectronics in the visible wavelength range.
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Broadband optical absorption by tunable Mie resonances in silicon nanocone arrays

TL;DR: The results show that the Mie resonance can be continuously tuned across a wide range of wavelength by varying the diameter of the nanopillars, and Si nanocone arrays can strongly interact with the incident light in the broadband spectrum and the absorbance is higher than 95% over the wavelength from 300 to 2000 nm.
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The impact of thickness and thermal annealing on refractive index for aluminum oxide thin films deposited by atomic layer deposition

TL;DR: It is found that the refractive index of Al2O3 thin films decrease with increasing film thickness and the changing trend revised after annealing, and this phenomenon is believed to arise from the mechanical stress in ALD-Al2O2 thin films.
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Optical properties of thickness-controlled MoS 2 thin films studied by spectroscopic ellipsometry

TL;DR: In this article, the authors synthesize different MoS 2 thin films with quantitatively controlled thickness and sizable thickness variation, which is vital to find out the thickness-dependent regularity.