Journal ArticleDOI
A comparison of two van-der-Pauw measurement configurations of resistivity
TLDR
In this paper, the authors compared two van-der-Pauw-type measurement configurations of resistivity, with respect to the movement of the point-like voltage and current contacts away from the periphery of a thin, square sample.About:
This article is published in Materials Science in Semiconductor Processing.The article was published on 2013-12-01. It has received 9 citations till now. The article focuses on the topics: Van der Pauw method & Displacement (vector).read more
Citations
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Journal ArticleDOI
The role of the nitrogen flow rate on the transport properties of CrN thin films produced by DC magnetron sputtering
TL;DR: In this paper, thin films of CrN were synthesized in a DC magnetron sputtering system using a mixture of Ar + N 2 and were examined using X-ray photoelectron spectroscopy (XPS) revealing Cr N bonds.
Journal ArticleDOI
Effect of Na Doping on the Properties of ZnS Thin Films and ZnS/Si Heterojunction Cells
TL;DR: In this article, the effect of Na doping on the properties of ZnS thin films was investigated via XRD, SEM, UV-Visible spectrometry and resistivity measurements.
Journal ArticleDOI
Compositional and electrical properties of Cr, Nb, Cr/Nb, CrNbN, and CrN/NbN multilayers grown using the d.c. magnetron sputtering technique
Angélica Garzón-Fontecha,H.A. Castillo,Daniel Escobar-Rincon,Elisabeth Restrepo-Parra,Wencel de la Cruz +4 more
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Determination of topological properties of thin samples by the van der Pauw method
TL;DR: In this paper, the authors solve the problem of determining basic topological properties of flat samples by performing measurements on their outer edge and show that the global maximum of four probe resistances shows a characteristic behaviour, which is dependent on the genus (i.e., the number of holes) of the domain.
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Easy and computer-time-saving implementation of the van der Pauw method including anisotropy and probe positioning correction factors using approximate closed-form analytical functions.
TL;DR: In this article , a closed-form analytical function is proposed to approximate the relations in a van der Pauw configuration using only basic operators, which can be easily implemented in a given software.
References
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Journal ArticleDOI
Four-point sheet resistance correction factors for thin rectangular samples
TL;DR: In this article, a conformal transformation technique is employed to determine the geometrical correction factor associated with four-point sheet resistance measurements of thin rectangular samples, which is useful in identifying sample geometries for which the correction factor is insensitive to the placement of the four electrodes on the interior of the sample.
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Measurement of the resistivity of a thin square sample with a square four-probe array
TL;DR: In this paper, the resistivity measurement error encountered with the square sample is presented in graphical form for use in test structure design, based on the method of images and is written in a compact, easily-evaluated form.
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A derivation of the van der Pauw formula from electrostatics
TL;DR: The van der Pauw formula for determining the electrical resistivity of an irregularly-shaped material was derived by him with the help of conformal mapping and is inherently two-dimensional Thus, it is valid in the limiting case of a sample of infinitesimal thickness as discussed by the authors.
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Generalization of the van der Pauw relationship derived from electrostatics
TL;DR: Weiss et al. as mentioned in this paper derived the van der Pauw relationship from a conducting material of rectangular cross section with contacts placed at the corners, which is a generalization of the previous work involving a square sample and a square array of electrodes that are not confined to the corners.