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Contouring by electronic speckle pattern interferometry employing dual beam illumination

Charles Joenathan, +2 more
- 01 May 1990 - 
- Vol. 29, Iss: 13, pp 1905-1911
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TLDR
The sensitivity and the orientation of the contour planes are analyzed and a novel method for tilting the planes of contours and experimental results incorporating phase shifting and fringe analysis are presented.
Abstract
In this paper we extend and study the method for generating contours of diffuse objects employing a dual beam illumination coupled with electronic speckle pattern interferometry. The sensitivity and the orientation of the contour planes are analyzed. A novel method for tilting the planes of contours and experimental results incorporating phase shifting and fringe analysis are also presented. The theoretical and the experimental results show good agreement.

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Journal ArticleDOI

Overview of three-dimensional shape measurement using optical methods

TL;DR: An overview of 3-D shape measurement using various optical methods, and a focus on structured light tech- niques where various optical configurations, image acquisition technology, data postprocessing and analysis methods and advantages and limitations are presented.
Patent

Apparatus and methods for surface contour measurement

TL;DR: In this paper, two sources of radiation having a spectral distribution and being coherent with respect to one another, a control system for moving each of the sources relative to each other, a detector positioned at the point on the surface of the object to receive radiation, and a processor for receiving signals from the detector.
Journal ArticleDOI

Double-pulse electronic speckle interferometry for vibration analysis.

TL;DR: A double-pulse electronic-speckle-interferometry system that uses three directions of illumination and one direction of observation to record at the same time all the information necessary for the reconstruction of the three-dimensional deformation vector.
Journal ArticleDOI

Strain measurement by three-dimensional electronic speckle pattern interferometry: potentials, limitations, and applications

TL;DR: The newly developed 3-D ESPI technique allows rapid measurement of both the shape and the3-D deformation of complex industrial components and is well suited for the harsh environmental conditions often found in the real test world.
References
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Book

Holographic and Speckle Interferometry: A Discussion of the Theory, Practice and Application of the Techniques

TL;DR: In this article, the authors present a technique for shape measurements using holographic and speckle pattern interferometry techniques, based on the concept of correlation interferometrics.
Journal ArticleDOI

Interferometric displacement measurement on scattering surfaces utilizing speckle effect

TL;DR: In this article, the distribution of intensity in the resultant pattern depends on the relative phases of the component patterns, and by measuring the correlation between the resultant patterns at two different times a change of relative phase is detected.
Journal ArticleDOI

Electronic speckle pattern interferometry

TL;DR: In this article, the Lougborough group in England, headed by Butters and Leendertz, viewed the technique more as an off-spring of their speckle work and they also introduced the name ESPI as an abbreviation for electronic specckle pattern interferometry.
PatentDOI

Contour generation by wavefront reconstruction

TL;DR: In this paper, a method of producing a multiplehologram of an object communicating with other objects is described. But the method is not applicable to the case of a single person communicating with multiple people.
Journal Article

A new method for generating depth contours holographically

TL;DR: Employing holographic techniques, Hildebrand and Haines have demonstrated that a multiple frequency source can be used to generate range contours on or near an image and it is shown that contours can be generated over much larger surfaces.
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