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Journal ArticleDOI

Phase-shifting speckle interferometry

Katherine Creath
- 15 Sep 1985 - 
- Vol. 24, Iss: 18, pp 3053-3058
TLDR
One application of phase-shifting techniques to speckle interferometry is finding the phase of deformations, where up to ten waves of wavefront deformation can easily be measured.
Abstract
Speckle patterns have high frequency phase data, which make it difficult to find the absolute phase of a single speckle pattern; however, the phase of the difference between two correlated speckle patterns can be determined. This is done by applying phase-shifting techniques to speckle interferometry, which will quantitatively determine the phase of double-exposure speckle measurements. The technique uses computer control to take data and calculate phase without an intermediate recording step. The randomness of the speckle causes noisy data points which are removed by data processing routines. One application of this technique is finding the phase of deformations, where up to ten waves of wavefront deformation can easily be measured. Results of deformations caused by tilt of a metal plate and a disbond in a honeycomb structure brazed to an aluminum plate are shown.

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Citations
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Book ChapterDOI

V Phase-Measurement Interferometry Techniques

TL;DR: The phase modulation in an interferometer can be induced by moving a mirror, tilting a glass plate, moving a grating, rotating a half-wave plate or analyzer, using an acoustooptic or electro-optic modulator, or using a Zeeman laser as mentioned in this paper.
Journal ArticleDOI

Digital recording and numerical reconstruction of holograms

TL;DR: The principles and major applications of digital recording and numerical reconstruction of holograms (digital holography) are described, which are applied to measure shape and surface deformation of opaque bodies and refractive index fields within transparent media.
Journal ArticleDOI

Direct phase determination in hologram interferometry with use of digitally recorded holograms

TL;DR: In this paper, the phase determination in hologram interferometry is performed using a CCD target and phase estimation from the digitally sampled holograms, which are then used to calculate the phase of the interference phase.
Journal ArticleDOI

Optical image compression and encryption methods

TL;DR: Optical processing methodologies, based on filtering, are described that are applicable to transmission and/or data storage and the advantages and limitations of a set of optical compression and encryption methods are discussed.
Journal ArticleDOI

Overview of the characteristics of micro- and nano-structured surface plasmon resonance sensors.

TL;DR: In this review, SPR sensors (from typical Kretschmann prism configurations to fiber sensor schemes) with micro- or nano-structures for local light field enhancement, extraordinary optical transmission, interference of surface Plasmon waves, plasmonic cavities, etc are discussed.
References
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ReportDOI

Statistical properties of laser sparkle patterns

TL;DR: In this article, the first order statistics of the observed electric-field strength, the observed light intensity, and observed light phase are examined, and the autocorrelation functions of the complex field and intensity processes are investigated, and that of the electric field is found to be proportional to the Fourier transform of the light intensity distribution incident on the scattering surface.
Book ChapterDOI

Statistical Properties of Laser Speckle Patterns

TL;DR: In this article, the first-order statistics of the complex amplitude, intensity and phase of speckle are derived for a free-space propagation geometry and for an imaging geometry.
Book

Holographic and Speckle Interferometry: A Discussion of the Theory, Practice and Application of the Techniques

TL;DR: In this article, the authors present a technique for shape measurements using holographic and speckle pattern interferometry techniques, based on the concept of correlation interferometrics.
Journal ArticleDOI

Installation et utilisation du comparateur photoélectrique et interférentiel du Bureau International des Poids et Mesures

P Carré
- 01 Jan 1966 - 
TL;DR: In this article, the photoelectric and interference comparator of the BIPM was described, together with its photoelectric microscopes, its installation (in particular, its anti-vibration mounting) and its auxiliary apparatus, including the interferometer, the refractometer and apparatus for temperature measurement.
Journal ArticleDOI

Speckle pattern and holographic techniques in engineering metrology

TL;DR: In this article, a new type of speckle pattern application is introduced which effectively samples the wavefront phase, enabling the interferometric measuring process to be carried out with low density data recording.
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