Journal ArticleDOI
Determination of the x-ray scattering lineshape from a Nb thin film using synchrotron radiation
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TLDR
In this paper, the X-ray scattering from a 400 AA thin film of Nb grown on sapphire has been performed using synchrotron radiation from a bending magnet.Abstract:
Detailed measurements of the X-ray scattering from a 400 AA thin film of Nb grown on sapphire have been performed using synchrotron radiation from a bending magnet. Bragg reflections from Nb planes perpendicular to the surface normal have a two-component lineshape: a sharp, essentially resolution-limited peak, superimposed on a diffuse Lorentzian-squared component. In contrast, Bragg peaks with a finite wavevector transfer in the plane of the film display the broad component only. These measurements indicate that the lattice mismatch between the metallic overlayer and substrate is relieved by the formation of domains randomly rotated in the plane of the film.read more
Citations
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Journal ArticleDOI
The growth and structure of epitaxial niobium on sapphire
TL;DR: A review of the experimental and theoretical work on the growth and structure of epitaxial niobium on sapphire is presented in this article, focusing on growth methods by molecular beam epitaxy (MBE) and sputtering techniques.
Journal ArticleDOI
X-ray diffraction peaks from partially ordered misfit dislocations
TL;DR: In this article, the x-ray diffraction peak profiles from distributions of misfit dislocations in the whole range of their positional correlations, from completely random to periodic, were calculated by Monte Carlo techniques.
Journal ArticleDOI
Energy dispersive x-ray reflectometry as a unique laboratory tool for investigating morphological properties of layered systems and devices
TL;DR: In this paper, the principles and technical aspects of the laboratory energy dispersive x-ray reflectometry technique (EDXR) are reviewed, in particular when accurate time-resolved studies are to be performed, and an overview of the most significant works in the field is also reported, in order to present the wide range of its possible applications.
Book ChapterDOI
Specular Reflectivity from Smooth and Rough Surfaces
Alain Gibaud,Guillaume Vignaud +1 more
TL;DR: In this paper, the authors present a general optical formalism used to calculate the reflectivity of smooth or rough surfaces and interfaces which is also valid for x-rays, and they use this formalism for surface science.
Dissertation
Growth and characterisation of uranium nanostructures
TL;DR: In this paper, the authors describe the growth by magnetron sputtering and characterisation of single-crystal epitaxial thin- films of alpha-uranium in the (110) orientation on the Nb(110)/A-plane sapphire buffer layer/substrate system.
References
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Journal ArticleDOI
Magnetic and structural properties of single-crystal rare-earth Gd-Y superlattices.
Journal ArticleDOI
Extraordinary alignment of Nb films with sapphire and the effects of added hydrogen
TL;DR: High-resolution x-ray scattering studies of the structural coherence of niobium films grown by molecular-beam epitaxy on sapphire substrates find evidence for a dramatic increase of the lateral coherence length.
Journal ArticleDOI
High-resolution x-ray-scattering study of the structure of niobium thin films on sapphire.
TL;DR: A detailed model of the structure of Nb films on sapphire is developed using high-resolution x-ray-scattering techniques and a frozen phonon model to relate the position of the satellites to the length of a terrace on the vicinalsapphire surface.
Journal ArticleDOI
Effect of substrate temperature on the microstructure of thin niobium films
TL;DR: In this article, Niobium films with constant thickness have been deposited on sapphire (11 2 0) by electron-beam evaporation at different substrate temperatures (150 °C ⊽TS ⩽ 750 °C).
Journal ArticleDOI
Structure of niobium thin films on sapphire
TL;DR: In this paper, the structure of Nb thin films grown by molecular beam epitaxy on sapphire has been studied using high-resolution x-ray scattering techniques, showing diffuse scattering with a Lorentzian-squared profile, and satellite Bragg peaks for certain orientations of the crystal.
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