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Journal ArticleDOI

Electroless nickel bumping of aluminum bondpads. II. Electroless nickel plating

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TLDR
In this article, the results of a number of experiments carried out to investigate the electroless nickel bumping of Al bondpads and highlights the issues that need to be considered when selecting materials and techniques.
Abstract
Electroless nickel has been used for many decades to provide a hard, corrosion resistant surface finish to engineering components. In recent years, its application has been extended to the electronics industry for the production of solderable surfaces on printed circuit boards, which utilize a further thin gold coating to prevent oxidation of the nickel surface. The recent interest in the use of flip-chip technology in electronics manufacture has required the development of low cost methods for solder bumping of semiconductor wafers. The electroless nickel process has been considered as a suitable candidate for the deposition of a solderable under bump metallization (UBM) layer onto the Al bondpads. However, the extension of existing electroless nickel plating processes to this new application requires greater understanding of the technique. In particular, the coating of the small isolated bondpads on the wafer surface introduces difficulties that make the use of many commercially available solutions impossible. This paper reports the results of a number of experiments carried out to investigate the electroless nickel bumping of Al bondpads and highlights the issues that need to be considered when selecting materials and techniques.

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Citations
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Journal ArticleDOI

Electroless nickel bumping of aluminum bondpads. I. Surface pretreatment and activation

TL;DR: In this paper, a number of experiments designed to characterize the activation of aluminum bondpads to electroless nickel plating, focusing on the effects of solution exposure time and bondpad composition.
Journal ArticleDOI

Microstructure and shear strength evolution of Sn-Ag-Cu solder bumps during aging at different temperatures

TL;DR: In this paper, the shear strength of solder bumps decreases at the initial stage of aging at 150°C and 175°C, and the strength degradation during aging may be caused by the coarsening of small Ag3Sn particles.
Journal ArticleDOI

Modification of a CMOS microelectrode array for a bioimpedance imaging system

TL;DR: In this article, a complete microsensor array with integrated circuitry, fabricated using a conventional complementary metal oxide semiconductor (CMOS) process, was presented for making cellular impedance measurements in a tissue culture.
Journal ArticleDOI

Galvanic replacement of electrodeposited nickel by palladium and investigation of the electrocatalytic activity of synthesized Pd/(Ni) for hydrogen evolution and formic acid oxidation

TL;DR: A series of controllable Pd/(Ni) catalysts were synthesized by the use of galvanic replacement between electrodeposited nickel and palladium in [PdCl4]2− containing solution as mentioned in this paper.
Journal ArticleDOI

Influence of Surfactants on the properties of electroless nickel boron (thallium and lead-free) coatings

TL;DR: In this article, the influence of surfactants on the properties of electroless nickel boron coatings was studied, and three different surfactant types were used for different purposes.
References
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Patent

Electroless nickel plating

TL;DR: HIGH STABILITY, AUTOCATALYTIC ELECTROLESS NICKEL PLATING BATH COMPRISING an AQUEOUS SOLUTION CONTAINing about 0.08-016 MOLE/LITER NICKels IONS, about 019-0.38 MOLE / LITER HYPOPHOSPHITE IONS and ESSENTIALLY about 035-3.14 MOLE or Liter CITRATE IONS as discussed by the authors.
Proceedings Article

Low Cost Flip Chip Technology

Proceedings ArticleDOI

Brittle interfacial fracture of PBGA packages soldered on electroless nickel/immersion gold

TL;DR: In this article, the authors describe brittle fracture in thermal enhanced, cavity-down printed circuit board (PCB) packages, in the as-reflowed and the aged conditions, showing that the fracture occurred at the interface between Ni/sub 3/Sn/sub 4/ and Ni-P.
Proceedings ArticleDOI

Fine pitch stencil printing of Sn/Pb and lead free solders for flip chip technology

TL;DR: In this article, a flip chip technology based on an electroless Ni/Au bumping process has been developed by IZM/TUB for flip chip soldering.
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