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Proceedings ArticleDOI

Exploring the Ability of Oscillation Based Test for Testing Continuous -Time Ladder Filters

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TLDR
This work presents an exploratory study on the ability of oscillation-based test (OBT) for testing continuous-time low-pass ladder filters, particularly, fifth and seventh order Butterworth and elliptic filters.
Abstract
In this work, we present an exploratory study on the ability of Oscillation-Based Test (OBT) for testing continuous- time low-pass ladder filters. Particularly, fifth and seventh order Butterworth and elliptic filters are addressed. We devote our effort in determining the efficiency of OBT for detecting deviation-faults in the filters components, using signal-flow graphs for modeling the filters. For implementing the OBT oscillators, we use non-linear elements in the feedback paths. The describing function approach is adopted for the mathematical treatment of the non-linear elements. Additionally, the oscillation conditions are established with a very good precision using Bode Plots. For characterizing our OBT schemes, we inject arbitrary deviation-faults and then establish the fault coverage. An alternative approach is also suggested in the paper, based in the assessment of the lowest deviations in each circuit parameter able to be detected using the proposed oscillators. In this way, it is possible to determine the hard-to-verify components.

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Citations
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Patent

Graph pruning scheme for sensitivity analysis with partitions

TL;DR: In this paper, a method of analyzing a circuit simulation comprising pruning a signal flow graph is presented, where the current vertex includes at least one of a sensitivity parameter or a sensitivity variable.
Journal ArticleDOI

On the ability of oscillation-based test for detecting deviation faults in switched-capacitor ladder filters

TL;DR: In this paper, the authors proposed the test of high-order switched-capacitor (SC) ladder filters by means of the oscillation-based test (OBT).
Journal ArticleDOI

A built-in self-test circuitry based on reconfiguration for analog and mixed-signal ic

Sergey Mosin
TL;DR: The built-in self test circuitry for analog and mixed-signal IC based on reconfiguring original circuit in oscillator, which does not need the generator of input test signals, has been proposed and provides possibility for joint testing analog and digital subcircuits of mixed-Signal IC.
Journal ArticleDOI

Design of an Oscillation-Based BIST System for Active Analog Integrated Filters in 0.18 µm CMOS

TL;DR: In this article, an oscillation-based built-in self-test system for active an analog integrated circuit was used to detect catastrophic and parametric faults, introduced during chip manufacturing, and the proposed test hardware detects parametric and catastrophic faults on changeable limits.
References
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Proceedings ArticleDOI

Oscillation-test strategy for analog and mixed-signal integrated circuits

TL;DR: The validity of the proposed test method has been verified throughout some examples such as operational amplifiers and analog-to-digital converter (ADC), which imply that oscillation-test strategy is very attractive for wafer-probe testing as well as final production testing.
Journal ArticleDOI

Oscillation-test methodology for low-cost testing of active analog filters

TL;DR: The design for testability (DFT) of active analog filters based on oscillation-test methodology is described and the DFT techniques investigated are very suitable for automatic testable filter synthesis and can be easily integrated in the tools dedicated to automatic filter design.
Proceedings ArticleDOI

Efficient and accurate testing of analog-to-digital converters using oscillation-test method

TL;DR: This paper describes a practical test approach for analog-to-digital converters (ADCs) based on the oscillation-test strategy, where no analog stimulus should be supplied and therefore the need for a costly precision signal generator is eliminated.
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