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Method of making a planar graded channel MOS transistor

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TLDR
In this article, a double diffusion through a self-aligned silicon gate is proposed for fabrication of a planar narrow channel MOSFET, where a first type dopant is diffused into the same selfaligned window of the source diffusion already diffused with another dopant.
Abstract
The method of fabrication of a planar narrow channel metal oxide semiconductor field effect transistor (MOSFET) by a double diffusion through a self-aligned silicon gate wherein a first type dopant is diffused into the same self-aligned window of the source diffusion already diffused with a second type dopant. The diffused source and drains are self-aligned by means of the silicon gate, thus permitting narrow gate lengths. The diffusion profile is such that the impurity concentration near the source is higher than that near the drain. When a reverse bias is applied between, for example, an n-type drain and a p-type diffused region, the depletion layer cannot widen as much toward the source as a uniform channel because of the impurity concentration profile. Thus a narrow channel length can be used withoout drain-source punch-through at low voltages. Meanwhile, the self-aligned silicon gate permits a close spacing between the source and drain contacts, thus reducing the feedback capacitance between the drain and the gate.

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Citations
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TL;DR: An asymmetric insulated-gate field effect transistor is configured in an asymmetric lightly doped drain structure that alleviates hot-carrier effects and enables the source characteristics to be decoupled from the drain characteristics.
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Method for making narrow channel FET by masking and ion-implantation

TL;DR: In this article, a method for making an FET comprising as many as three parallel channels having different threshold voltages was proposed, which is applicable to both silicon and metal gate technology, to n-channel and p-channel.
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Method for fabricating self-aligned semiconductor devices utilizing selectively etchable masking layers

TL;DR: In this paper, a method for fabricating self-aligned regions of semiconductor devices such as bipolar or field effect transistors using three masking layers which are selectively etchable with respect to each other on the surface of the semiconductor body is presented.
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TL;DR: In this article, the static electricity generated during dry etching for opening the contact holes moves from the gate signal line, damages a gate insulating film, passes the crystalline semiconductor film, and again damages the gate INSulating film before it reaches the gate Signal Line.
References
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Patent

Modification of channel regions in insulated gate field effect transistors

TL;DR: In this article, a method of producing channel regions in IGFETs by implanting ions in the gate region through the gate, the gate of polycrystalline silicon material.
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Planar silicon gate mos process

TL;DR: In this paper, a method of MANUFACTURING a METAL INSULator SEMICONDUCTOR FIELD EFFECT TRANSISTOR HAV- ING A SOURCE, DRAIN an CHANNEL REGION and a GATE FORMED over the CHANEL region.
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Production of silicon insulated gate and ion implanted field effect transistor

TL;DR: In this article, a method of manufacturing a METAL INSULATOR is described, in which the FIELD INSULATOR is first formed on a SEMICONDUCTOR SUBSTRATE, which is of one CONDUCTIVITY type, and then the body is subjected to ION IMPLATATION of the DOPING IMPURITIES of OPPOSITE CONDCCIVITY Type THROUGH SAID OPENINGS to form the RESPECTIVE SOURCE and DRAIN regions.
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Washed emitter method for improving passivation of a transistor

TL;DR: In this article, an improved method for fitting a transistor based on the washed-emitter method is presented, where an original SILICON DIOXIDE FILM, USED at a mask for base DIFFUSION, is removed from the surface of the SILICon TRANSISTOR BODY after a base region is forgered by dif-fusion and a new INSULATION FILM is used to stabilize the surface property of the body.