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Journal ArticleDOI

Oscillations of injected carriers in p-type indium antimonide

TLDR
In this article, a negative differential resistivity region (NDR) is observed in the current-voltage characteristics at 77 K. In this NDR region, oscillations of the voltage drop, under constant current conditions, can occur which are most pronounced in magnetic fields of some 10 G.
Abstract
In n+–p–p+ structures made of p-InSb a negative differential resistivity region (NDR) is observed in the current-voltage characteristics at 77 K. In this NDR region, oscillations of the voltage drop, under constant current conditions, can occur which are most pronounced in magnetic fields of some 10 G. Their frequency is of the order of 10 kHz. It could be shown experimentally that the oscillations occur simultaneously over the whole length of the sample and that they are due to radial oscillations of a plasma channel which are caused by trapping and recombination of injected carriers. In n+–p–p+-Strukturen von p-leitendem InSb wird ein negativer differentieller Widerstandsbereich (NDR) in den Strom-Spannungscharakteristiken bei 77 K beobachtet. In diesem NDR-Bereich konnen unter der Bedingung konstanten Stromes Oszillationen des Spannungsabfalls auftreten, die bei Magnetfeldern von einigen 10 G am ausgepragtesten sind. Ihre Frequenz ist von der Grosenordnung 10 kHz. Es wird experimentell nachgewiesen, das die Oszillationen gleichzeitig uber die gesamte Probenlange auftreten und das sie durch radiale Oszillationen eines Plasmakanals hervorgerufen werden, die durch Trapping und Rekombination von injizierten Ladungstragern verursacht werden.

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References
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Journal ArticleDOI

Carrier Lifetime in Indium Antimonide

R. A. Laff, +1 more
- 01 Jan 1961 - 
Journal ArticleDOI

Recombination Centers in InSb

TL;DR: In this article, a study of the temperature dependence of the lifetime and Hall coefficient in p and n-type InSb with extrinsic carrier concentrations ranging respectively from 1×1013 to 4×1015 cm 3 and from 2×1012 to 5×1014 cm 3, was made by means of the phase shift method.
Journal ArticleDOI

Current oscillations in deep-level doped semiconductors

TL;DR: In this article, the authors observed current oscillations in p-i-n (and optically excited n-I-n) devices containing deep levels and found that the oscillations occur in the positive resistance region of the SCL current regime of the I-V characteristics, before the occurrence of double-injection breakdown.
Journal ArticleDOI

Current Instability in Germanium due to Excitation of the Recombination Waves

TL;DR: In this article, spontaneous current oscillations were observed at room temperature or near it, and for an electric field strength of several tenths of V/cm, the oscillation frequency was in the range of 0.1 to 1 MHz.
Journal ArticleDOI

RECOMBINATION WAVES IN Au‐DOPED Si

TL;DR: Theoretical computation of recombination waves in Au-doped Si is reconsidered in this paper, introducing new expressions of the carrier lifetimes, deduced from a linearized theory of the generation-recombination process kinetics.
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