Journal ArticleDOI
Oxide-bias Measurements in the Silicon Photodiode Self-calibration Technique
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TLDR
In this article, it has been shown that it is necessary to restrict the applied bias voltage to the very minimum necessary to produce photocurrent saturation, otherwise non-reversible degradation of quantum efficiency may occur.Abstract:
Oxide-bias measurement techniques to determine front-surface recombination losses in the silicon photodiode self-calibration technique have been investigated. With the water-drop method it has been shown necessary to restrict the applied bias voltage to the very minimum necessary to produce photocurrent saturation, otherwise non-reversible degradation of quantum efficiency may occur. The corona technique has been found to give satisfactory results only on initial application, as a drastic increase in front-region recombination loss is produced.read more
Citations
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Journal ArticleDOI
Trap Detectors and their Properties
TL;DR: In this article, the authors describe a new solid state detector which fulfils all the requirements of the ideal detector for optical radiation measurements, which is spatially uniform, linear, stable and has a predictable relative spectral response.
Journal ArticleDOI
Quantum efficiency stability of silicon photodiodes
Raj Korde,Jon Geist +1 more
TL;DR: The major result of this work is the demonstration that n on p photodiodes are inherently more stable than p on n types in the ultraviolet and blue spectral regions, but that stable p onn devices can also be produced with sufficient care.
Journal ArticleDOI
Intercomparison between two independent primary radiometric standards in the visible and near infrared: a cryogenic radiometer and the electron storage ring BESSY.
TL;DR: An intercomparison has been performed in the visible and near infrared between two radiometric standards: the electron storage ring BESSY and a cryogenic absolute radiometer, confirming the 3 × 10−3 uncertainty of BessY.
Journal ArticleDOI
A Physical Basis for the Extrapolation of Silicon Photodiode Quantum Efficiency into the Ultraviolet
N M Durant,N P Fox +1 more
TL;DR: In this article, the errors associated with modelling the quantum efficiency of high quality silicon photodiodes in the ultraviolet using the semiconductor device-modeling program PC1D are discussed.
Journal ArticleDOI
Numerical Modelling of Short-wavelength Internal Quantum Efficiency
TL;DR: In this paper, the spectral shape of the internal quantum deficiency (one minus the quantum efficiency) is virtually independent of the density of charge trapped in the oxide, and of the surface-recombination velocity at the oxide-silicon interface.
References
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Journal ArticleDOI
Silicon photodiode absolute spectral response self-calibration
Edward F. Zalewski,Jon Geist +1 more
Journal ArticleDOI
Spectral response self-calibration and interpolation of silicon photodiodes.
TL;DR: The possibility of interpolating the internal quantum efficiency of silicon photodiodes using a model with three adjustable parameters is investigated, and an insignificant difference was observed at 677 nm.
Journal ArticleDOI
Precision Measurements and Fundamental Constants
F. M. Pipkin,Rogers C. Ritter +1 more
TL;DR: Recent developments in the techniques for making precision measurements and their use in the determination of the fundamental constants are reviewed and the relevance of precision measurements to tests of general relativity is briefly discussed.
Journal ArticleDOI
Elimination of interface recombination in oxide passivated silicon p + n photodiodes by storage of negative charge on the oxide surface
TL;DR: The use of tin oxide, condensed water vapor, and water drop electrodes on the oxide surface as well as corona charging of the surface are compared in their ability to repel minority carriers from recombination sites at the oxide-silicon interface without compromising the optical properties of the photodiode.
Journal ArticleDOI
Silicon photodiode absolute spectral response self-calibration using a filtered tungsten source.
TL;DR: In this paper, a method of extending the silicon photodiode absolute spectral response self-calibration techniques to non-laser wavelengths using a tungsten source filtered with narrow well-characterized interference filters is described.