Journal ArticleDOI
Raman studies of the thermal oxide of silicon
F. L. Galeener,J.C. Mikkelsen +1 more
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In this paper, the Raman spectra of silicon oxide films that have been formed by the wet oxidation of Si wafers at ∼ 10 atmospheres of steam and at temperatures near 800° C were reported.About:
This article is published in Solid State Communications.The article was published on 1981-03-01. It has received 27 citations till now. The article focuses on the topics: Silicon oxide & Oxide.read more
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Raman and infrared spectra on silica gel evolving toward glass
TL;DR: In this article, the infrared and Raman spectra of gels obtained from specially prepared solutions of Si(OC2H5)4 (TEOS) which have been thermally treated in the 40-800°C temperature range, are reported and discussed with reference to the spectrum of fused quartz, showing that the gel to glass transformation is an hydrolytic polycondensation process, which takes plase gradually and is practically completed in the samples treated at 800°C.
Journal ArticleDOI
Silicon Growth at the Two-Dimensional Limit on Ag(111)
Andrew J. Mannix,Brian Kiraly,Brian Kiraly,Brandon Fisher,Mark C. Hersam,Nathan P. Guisinger +5 more
TL;DR: Even at the 2D limit, scanning tunneling spectroscopy shows that the sp(3)-bonded silicon nanosheets exhibit semiconducting electronic properties.
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Trace gas Raman spectroscopy using functionalized waveguides
Scott A. Holmstrom,Todd H. Stievater,Dmitry A. Kozak,Marcel W. Pruessner,Nathan F. Tyndall,William S. Rabinovich,R. Andrew McGill,Jacob B. Khurgin +7 more
TL;DR: In this article, the first trace gas Raman spectra using integrated nanophotonic waveguides were collected using 9.6 mm-long waveguide exposed to ambient trace concentrations of ethyl acetate, methyl salicylate, and dimethyl sulfoxide with one-sigma limits of detection in 100 s integration times equal to 600 ppm, 360 ppb, and 7.6 ppb.
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Microstructure and in vitro behaviour of 45S5 bioglass coatings deposited by high velocity suspension flame spraying (HVSFS)
Lina Altomare,Devis Bellucci,Giovanni Bolelli,Benedetta Bonferroni,Valeria Cannillo,L. De Nardo,Rainer Gadow,Andreas Killinger,Luca Lusvarghi,Antonella Sola,N. Stiegler +10 more
TL;DR: HVSFS-deposited 45S5 bioglass coatings are therefore highly bioactive and have potentials as replacement of conventional hydroxyapatite in order to favour osseointegration of dental and prosthetic implants.
Journal ArticleDOI
Silicene, Siloxene, or Silicane? Revealing the Structure and Optical Properties of Silicon Nanosheets Derived from Calcium Disilicide
Bradley J. Ryan,Michael P. Hanrahan,Michael P. Hanrahan,Yujie Wang,Utkarsh Ramesh,Charles K. A. Nyamekye,Charles K. A. Nyamekye,Rainie D. Nelson,Zhaoyu Liu,Zhaoyu Liu,Chuankun Huang,Chuankun Huang,Bevan Whitehead,Jigang Wang,Jigang Wang,Luke T. Roling,Emily A. Smith,Emily A. Smith,Aaron J. Rossini,Aaron J. Rossini,Matthew G. Panthani +20 more
TL;DR: Si-nanosheets (Si-NSs) have recently attracted considerable attention due to their potential as next-generation materials for electronic, optoelectronic, spintronic, and catalytic applications as mentioned in this paper.
References
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Journal ArticleDOI
Longitudinal Optical Vibrations in Glasses: Ge O 2 and Si O 2
F. L. Galeener,G. Lucovsky +1 more
TL;DR: In this article, longitudinal optical (LO) vibrational modes account for several previously unexplained peaks in the Raman spectra of vitreous Ge${\mathrm{O}}_{2}$ and Si${O}
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Water and its relation to broken bond defects in fused silica
R. H. Stolen,G. E. Walrafen +1 more
TL;DR: In this paper, the effects of water and defects on the Raman spectrum of fused silica have been studied and it has been shown that water in the melt is preferentially trapped at the defect sites.
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Dependence of Interface State Density on Silicon Thermal Oxidation Process Variables
Reda R. Razouk,Bruce E. Deal +1 more
TL;DR: The structural or intrinsic type of interface state charge related to thermal oxidation and annealing processes has been characterized with respect to silicon thermal oxidation variables using quasistatic C-V techniques.
Journal ArticleDOI
Neutron irradiation effects and structure of noncrystalline SiO2
TL;DR: In this article, the defects produced by fast neutron irradiation (E > 0.18 MeV) have been investigated by Raman and infrared spectroscopy, smallangle x-ray scattering, and electron microscopy.