Patent
Sequential test pattern generation using clock-control design for testability structures
TLDR
In this article, a design for testability (DFT) structure is used to provide partitioning of a master clock into multiple clock signals each associated with a corresponding one of the levels of self-loops, so as to permit breaking of the feedback loops other than the selfloops.Abstract:
Techniques for testing a sequential circuit comprising a plurality of flip-flops or other types of registers. The circuit is first configured such that substantially all feedback loops associated with the registers, other than one or more self-loops each associated with a corresponding one of the registers, are broken. Test patterns are then generated for application to the circuit. The test patterns are applied to the circuit in conjunction with partitioned clock signals each of which is associated with a corresponding level of the circuit containing at least one of the self-loops. In an illustrative embodiment, a design for testability (DFT) structure is used to provide partitioning of a master clock into multiple clock signals each associated with a corresponding one of the levels of self-loops, so as to permit breaking of the feedback loops other than the self-loops. The registers of the circuit may be arranged in the particular levels by assigning a first one of the levels to each register which is fed only by primary inputs (PIs) of the circuit, and then assigning to level i+1 every register that is fed by other registers whose maximum level is i, where i=1, 2, . . . d, and d is the sequential depth of the circuit. In addition, each of the levels of registers may have multiple groups of registers associated therewith, with each of the groups being subject to clocking by one of the partitioned clock signals through the operation of group selection circuitry.read more
Citations
More filters
Patent
Enhanced hardware debugging with embedded FPGAS in a hardware description language
TL;DR: In this article, techniques and systems for analysis, diagnosis and debugging fabricated hardware designs at a Hardware Description Language (HDL) level are described, where the hardware designs have been designed in HDL and have been fabricated in integrated circuit products with limited input/output pins.
Patent
Tuple propagator and its use in analysis of mixed clock domain designs
TL;DR: In this article, a tuple being propagated is added to a list of zero or more tuples currently identified with a circuit element, unless a tuple of the same signal name is already present in the list.
Patent
Design verification using sequential and combinational transformations
TL;DR: In this article, a model of an integrated circuit is first unfolded for N time steps to create a combinational representation of the design and then a sequence of at least one combinational transformation algorithms is then performed on the unfolded design to produce a simplified unfolded model.
Patent
Single-pass methods for generating test patterns for sequential circuits
TL;DR: In this paper, a single pass method for generating test patterns for sequential circuits operates upon an iterative array of time-frames representing the circuit and a mapping function is inserted at the end of each time-frame.
Patent
Method and device for high speed testing of an integrated circuit
TL;DR: In this paper, the authors propose a method for testing an integrated circuit by providing a first high frequency clock signal sequence to a first group of components during a test sequence, characterized by receiving, by a first memory circuit within the integrated circuit, at a low reception rate, a high frequency signal pattern information and a first low frequency signal patterns.
References
More filters
Journal ArticleDOI
PROOFS: a fast, memory-efficient sequential circuit fault simulator
TL;DR: The authors describe PROOFS, a fast fault simulator for synchronous sequential circuits that achieves high performance by combining all the advantages of differential fault simulation, single fault propagation, and parallel fault simulation while minimizing their individual disadvantages.
Journal ArticleDOI
The Ballast methodology for structured partial scan design
Rajiv Gupta,Melvin A. Breuer +1 more
TL;DR: An efficient partial scan technique called Ballast (balanced structure scant test) is presented, which leads to a low area overhead and allows 100% coverage of irredundant faults.
Journal ArticleDOI
SMART And FAST: Test Generation for VLSI Scan-Design Circuits
TL;DR: New concepts and algorithms used to generate tests for VLSI scan-design circuits are described, including a low-cost fault-independent algorithm, a fault-oriented algorithm, and an algorithm for dynamic test set compaction.
Journal ArticleDOI
An efficient algorithm for sequential circuit test generation
TL;DR: An efficient sequential circuit automatic test generation algorithm based on PODEM and uses a nine-valued logic model that saves both the good and the faulty machine states after finding a test to aid in subsequent test generation.
Proceedings ArticleDOI
Identifying sequential redundancies without search
TL;DR: An efficient algorithm, FIRES, is presented, to identify c-cycle redundancies without search and it is shown that the redundant faults identified by FIRES are not easy targets for state-of-the-art sequential rest generators.