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Journal ArticleDOI

Spectroscopy of excited states in In 0.53 Ga 0.47 As-InP single quantum wells grown by chemical-beam epitaxy

R. Sauer, +2 more
- 15 Dec 1986 - 
- Vol. 34, Iss: 12, pp 9023-9026
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TLDR
The photoluminescence excitation (PLE) spectra were reported for six single quantum wells with thicknesses between 130 and 23 \AA{} grown on the same wafer by chemical-beam epitaxy.
Abstract
Photoluminescence excitation (PLE) spectra are reported for six single quantum wells with thicknesses between 130 and 23 \AA{} grown on the same wafer by chemical-beam epitaxy. The very strong, narrow line emission from these high-quality quantum wells enabled us to perform PLE with a lamp-monochromator combination as the excitation source. All of the observed excitonic absorption peaks are assigned. Good fits to the spectra can be made with band offsets of ${Q}_{e}\ensuremath{\approx}60%$ and ${Q}_{h}\ensuremath{\approx}40%$ and masses ${m}_{e}^{*}=0.041{m}_{0}$, ${m}_{\mathrm{hh}}^{*}=0.465{m}_{0}$, and ${m}_{\mathrm{lh}}^{*}=0.085{m}_{0}$. Energy-dependent corrections for ${m}_{e}^{*}$ due to conduction-band nonparabolicities are essential for these fits and yield ${\ensuremath{\gamma}}_{e}=3.3\ifmmode\times\else\texttimes\fi{}{10}^{\ensuremath{-}15}$ ${\mathrm{cm}}^{2}$ for the ${\ensuremath{\gamma}}_{e}{k}^{4}$ correction term in the energy dispersion.

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Journal ArticleDOI

Material parameters of InGaAsP and InAlGaAs systems for use in quantum well structures at low and room temperatures

TL;DR: In this paper, a comprehensive and systematic set of material parameters for (Al,In)GaAs/GaAs, (In,Ga)AlAs/InGaAs quantum well systems have drawn a lot of attention.
Book ChapterDOI

Band Offsets in Semiconductor Heterojunctions

TL;DR: In this article, the authors present an overview of several theoretical approaches and experimental measurement techniques for determining band offset values and discuss the experimental and theoretical data reported for a number of specific heterojunction systems.
Journal ArticleDOI

Photoluminescence excitation spectroscopy of InAs 0.67 P 0.33 /InP strained single quantum wells

TL;DR: In this article, the optical emission characteristics of biaxially compressed InAs x P1− x /InP strained single quantum well (QW) structures, with nominal compositionx=0.67, have been investigated using photoluminescence (PL) and photoline excitation (PLE) spectroscopies.
Journal ArticleDOI

Measurement of InP/In0.53Ga0.47As and In0.53Ga0.47As/In0.52Al0.48As heterojunction band offsets by x‐ray photoemission spectroscopy

TL;DR: In this paper, the authors used X-ray photoemission spectroscopy (XPS) to measure the valence-band offset ΔEv for the lattice matched InP/In0.53Ga0.47As and In0.52Al0.48As heterojunction interfaces.
Journal ArticleDOI

Optical properties of III–V strained-layer quantum wells

TL;DR: In this paper, the optical properties of a set of periodically structured samples covering a wide range of biaxially compressive and tensile strain are compared with those of lattice-matched In 0.53 Ga 0.47 As/InP structures.
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