scispace - formally typeset
Journal ArticleDOI

Symmetries of cross-polarization diffraction coefficients of gratings

Lifeng Li
- 01 May 2000 - 
- Vol. 17, Iss: 5, pp 881-887
Reads0
Chats0
TLDR
An analytical proof is given to show that the observed identity is merely a manifestation of the electromagnetic reciprocity theorem for the 0th-order diffraction of symmetrical gratings.
Abstract
In a recent paper [J. Opt. Soc. Am. A16, 1108 (1999)] Logofǎtu et al. demonstrated by experimental and numerical evidence that the 0th-order cross-polarization (s to p and p to s) reflection coefficients of isotropic, symmetrical, surface-relief gratings in conical mount are identical. Here an analytical proof is given to show that the observed identity is merely a manifestation of the electromagnetic reciprocity theorem for the 0th-order diffraction of symmetrical gratings. The above result is further generalized to bianisotropic gratings, to the 0th-order cross-polarization transmission coefficients, and to the mth-order reflection and transmission coefficients when the wave vector of the incident plane wave and the negative of the wave vector of the mth reflected order are symmetrical with respect to the plane perpendicular to the grating grooves.

read more

Citations
More filters
Journal ArticleDOI

Optical activity in planar chiral metamaterials: Theoretical study

TL;DR: In this article, a thorough theoretical study of the optical activity in planar chiral metamaterial (PCM) structures, made of both dielectric and metallic media, is conducted by the analysis of gammadion-shaped nanoparticle arrays.
Patent

Tuning the index of a waveguide structure

TL;DR: In this paper, the index of refraction of waveguide structures can be varied by altering carrier concentration, which can be used to implement a variety of functionalities including tunable waveguide gratings and resonant cavities, switchable couplers, modulators, and optical switches.
Journal ArticleDOI

Application of Mueller polarimetry in conical diffraction for critical dimension measurements in microelectronics

TL;DR: This work investigates the potential of spectral Mueller polarimetry in conical diffraction for the characterization of 1D gratings, with particular emphasis on small critical dimensions (CDs).
Patent

Overlay measurements using periodic gratings

TL;DR: In this paper, the first and second sets of gratings are formed on the wafer using a first mask and a second mask, respectively, and the misalignment between them is determined based on the measured diffraction signal.
Patent

Structure and method for coupling light between dissimilar waveguides

TL;DR: In this paper, a strip loaded waveguide is proposed, where a guiding region is provided for propagating an optical mode and this guiding region extends both within the strip and the slab.
References
More filters
Journal ArticleDOI

Identity of the cross-reflection coefficients for symmetric surface-relief gratings

TL;DR: In this paper, the zeroth-order cross-reflection coefficients of a surface-relief grating are shown to be equal from experimental evidence and numerical evidence by use of rigorous coupled-wave analysis simulations.
Journal ArticleDOI

Analysis of planar waveguide grating couplers with double surface corrugations of identical period

TL;DR: In this paper, a planar waveguide grating couplers with double surface corrugations of identical period were analyzed using the ray-optics technique and by using the rigorous diffraction grating theory.
Journal ArticleDOI

The Reciprocity Theorem for Corrugated Surfaces Used in Conical Diffraction Mountings

TL;DR: In this article, the reciprocity theorem for gratings used in classical diffraction is generalized to the case where the incident wave propagates outside the cross-section plane of the grating (conical diffraction).
Related Papers (5)