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The iii-v photocathode: a major detector development

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TLDR
In this article, the vacuum level at the surface lies below the bottom of the conduction band in the bulk of the material and the threshold of response is set by the III-V bandgap.
Abstract
Description of new (III-V) photocathodes which show improvements in sensitivity of as much as ten to a hundred times over conventional cathodes in the near infrared and useful improvements at shorter wavelengths. The development stems from a combination of basic knowledge of the photoemission process, gained in the 1950s, and the advancing understanding of the technology of III-V materials, in the 1960s. The superior performance of these cathodes is due to the fact that the vacuum level at the surface lies below the bottom of the conduction band in the bulk of the material. Consequently, the threshold of response is set by the III-V bandgap. The bandgap (and the threshold of response) can be varied by alloying different III-V materials together. A reduction in thermionic emission is realized with these cathodes. At present no semitransparent III-V cathodes with comparably interesting performance are available. The problems hindering further improvements, as well as the problems of placing these cathodes in practical multipliers and image tubes, are discussed briefly.

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Journal ArticleDOI

GaAs, AlAs, and AlxGa1−xAs: Material parameters for use in research and device applications

TL;DR: In this article, a review of the properties of the Al x Ga1−x As/GaAs heterostructure system is presented, which can be classified into sixteen groups: (1) lattice constant and crystal density, (2) melting point, (3) thermal expansion coefficient, (4), lattice dynamic properties, (5) lattices thermal properties,(6) electronic-band structure, (7) external perturbation effects on the bandgap energy, (8) effective mass, (9) deformation potential, (10) static and
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Negative affinity 3–5 photocathodes: Their physics and technology

TL;DR: Negative electron affinity (NEA) photocathodes are defined by the relationship between the potential barrier at the surface and the bottom of the conduction band in the bulk of the material as discussed by the authors.
Journal ArticleDOI

The application of semiconductors with negative electron affinity surfaces to electron emission devices

TL;DR: A comprehensive review of the characteristics and applications of these materials is presented, the concept of negative electron affinity (NEA) is described, and a comparison is made between NEA and conventional emitters as mentioned in this paper.
Journal ArticleDOI

The oxidation of Cs—uv photoemission studies

TL;DR: In this paper, a very narrow peak appears in the energy distribution curves (EDC) about 2.6 eV below the Fermi level Ef and grows with increasing exposure, associated with oxygen ions dissolved in the cesium metal below the surface.
Journal ArticleDOI

Photoemission from Metallic Cesium Oxide Films

TL;DR: In this article, the ultraviolet photoelectron spectra of Cs evaporated onto Ag and oxidized under ultra-high-vacuum conditions have been measured, and the time variation of the spectra indicates the formation of suboxides.
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