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Journal ArticleDOI

The role of surface forces in metal–metal contacts

M. D. Pashley, +1 more
- 01 May 1985 - 
- Vol. 3, Iss: 3, pp 757-761
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TLDR
In this article, the force required to separate the contact after a known load has been applied can be measured together wtih the area of contact (determined from electrical resistance), and the behavior is dominated by the action of surface forces which may themselves be strong enough to initiate plastic flow.
Abstract
A real metal–metal contact involves the interaction between many small asperities on each surface. It is the way that these asperities deform and adhere that determines the more macroscopic properties of friction and wear. It is possible to investigate the interaction of a single asperity with another surface by contact experiments between a sharp metal point (1 μm radius) and a flat surface. This type of experiment also enables the interfacial adhesive energy to be directly measured. This parameter is important in thin film adhesion. In order to achieve true metal–metal contact, the experiments are performed on cleaned specimens in ultrahigh vacuum. The force required to separate the contact after a known load has been applied can be measured together wtih the area of contact (determined from electrical resistance). Results show that at very low applied loads the behavior is dominated by the action of surface forces which may themselves be strong enough to initiate plastic flow. There is also direct as w...

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Citations
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Atomic Resolution with Atomic Force Microscope

TL;DR: The atomic force microscope (AFM) is a promising new method for studying the surface structure of both conductors and insulators as discussed by the authors, achieving a resolution better than 2.5 A.
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Measurements of the atomistic mechanics of single crystalline silicon wires of nanometer width

TL;DR: In this article, the elastic limit, Young's modulus, and strength of individual Si nanowires were investigated based on the mechanics of materials at an atomic scale, and it was found that both Young modulus and strength increased to $18.2$ and $5.3em, respectively.
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Lateral MEMS microcontact considerations

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