X-ray diffraction line profile analysis for defect study in Zr-2.5% Nb material
TLDR
In this paper, the authors presented the X-ray diffraction peaks shape analysis and their broadening with different thermal treatments in Zr -2·5% Nb pressure tube material and the peak shape was analyzed using Fourier transformation and information about coherent domain size, micro-strain and dislocation density could be obtained from the Fourier coefficients of the peak.Abstract:
The microstructure characterization by X-ray line profile analysis is possible for determination of dislocation density, micro-strain within grains due to dislocation and average cohe rent domain size (sub- grain) within the grain. This study presents the X -ray diffraction peaks shape analysis and their broadening with different thermal treatments in Zr -2·5% Nb pressure tube material. The peak shape is analysed using Fourier transformation and information about coherent domain size, micro-strain and dislocation density could be obtained from the Fourier coefficients of the peak. Analysis of broadening of the peaks by integral breadth method also gives the coherent domain size, dislocation density and micro -strain present in the mate- rial. The results from the X-ray techniques are comparable to those obtained from direct observation of transmission electron microscopy. The measured yield strength increases with dislocation density. An empir i- cal relationship is obtained for the yield strength from the dislocation density of the material. The measured strength is in agreement with the one calculated from dislocation density.read more
Citations
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References
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A Numerical Fourier-analysis Method for the Correction of Widths and Shapes of Lines on X-ray Powder Photographs
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On Variance as a Measure of Line Broadening in Diffractometry General Theory and Small Particle Size
TL;DR: In this article, it was shown that the mean-square breadth of a truncated portion of a diffraction line can be expressed in the form W26 = (Kλδ(2θ)/2π2p cosθ) - (Lλ2/4π 2p2 cos2 θ) where p is the cube root of the particle volume, Δ(2α) is the range of 2α used in evaluating W2α, and L is a quantity analogous to the Scherrer constant, for which the name taper parameter is
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