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A. Fontcuberta i Morral

Researcher at Technische Universität München

Publications -  56
Citations -  3322

A. Fontcuberta i Morral is an academic researcher from Technische Universität München. The author has contributed to research in topics: Nanowire & Silicon. The author has an hindex of 30, co-authored 56 publications receiving 3225 citations. Previous affiliations of A. Fontcuberta i Morral include École Polytechnique Fédérale de Lausanne & California Institute of Technology.

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Ga-assisted catalyst-free growth mechanism of GaAs nanowires by molecular beam epitaxy

TL;DR: In this article, the axial and radial growth rates of Ga-assisted GaAs nanowires grown by molecular beam epitaxy are investigated and a model that is able to accurately describe the presented observations and predicts a maximum length of non-tapered GaAs wires of approximately 40m is presented.
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Gallium arsenide p-i-n radial structures for photovoltaic applications

TL;DR: In this paper, the currentvoltage characteristics of single nanowires were measured in the dark and under various illumination conditions including 1.5 AM, and the total efficiency was 4.5%.
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Nucleation mechanism of gallium-assisted molecular beam epitaxy growth of gallium arsenide nanowires

TL;DR: In this paper, a GaAs nanowire was synthesized by using a beam epitaxy Ga-assisted synthesis of GaAs wafer, and the nucleation and growth were seen to be related to the presence of a SiO2 layer previously deposited on the wafer.
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Impact of surfaces on the optical properties of GaAs nanowires

TL;DR: In this article, the effect of surfaces on the optical properties of GaAs nanowires is evidenced by comparing Nanowires with or without an AlGaAs capping shell as a function of the diameter.
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Structure and hydrogen content of polymorphous silicon thin films studied by spectroscopic ellipsometry and nuclear measurements

TL;DR: In this article, the tetrahedron model was used to determine the hydrogen content, the crystalline fraction, and the void fraction of amorphous and polymorphous silicon films from UV-visible spectroscopic ellipsometry measurements.