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Angus I. Kingon
Researcher at Brown University
Publications - 364
Citations - 15457
Angus I. Kingon is an academic researcher from Brown University. The author has contributed to research in topics: Thin film & Ferroelectricity. The author has an hindex of 59, co-authored 361 publications receiving 14582 citations. Previous affiliations of Angus I. Kingon include North Carolina State University & DuPont.
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Journal ArticleDOI
Ferroelectric thin films: Review of materials, properties, and applications
Nava Setter,Dragan Damjanovic,L. Eng,Glen R. Fox,Spartak Gevorgian,Seungbum Hong,Angus I. Kingon,Hermann Kohlstedt,N. Y. Park,G. B. Stephenson,I. Stolitchnov,A. K. Taganstev,D. V. Taylor,Tomoaki Yamada,Stephen K. Streiffer +14 more
TL;DR: An overview of the state of the art in ferroelectric thin films is presented in this paper, where the authors review applications: micro-systems' applications, applications in high frequency electronics, and memories based on Ferroelectric materials.
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Alternative dielectrics to silicon dioxide for memory and logic devices
TL;DR: Development of higher permittivity dielectrics for dynamic random-access memories serves to illustrate the magnitude of the now urgent problem of identifying alternatives to silicon dioxide for the gate dielectric in logic devices, such as the ubiquitous field-effect transistor.
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The dielectric response as a function of temperature and film thickness of fiber-textured (Ba,Sr)TiO3 thin films grown by chemical vapor deposition
TL;DR: The temperature and field-dependent permittivities of fiber-textured Ba0.7Sr0.3TiO3 thin films grown by liquid-source metalorganic chemical vapor deposition were investigated as a function of film thickness as discussed by the authors.
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Leakage currents in Ba0.7Sr0.3TiO3 thin films for ultrahigh-density dynamic random access memories
TL;DR: In this paper, the Schottky approximation was used to explain the super-ohmic behavior at higher fields, but the barrier lowering is stronger than expected from this theory, while the leakage mechanism is comparable to SrTiO3 thin films prepared by chemical solution deposition, the absolute values of the leakage current are significantly lower for metalorganic chemical vapor deposition (MOCVD) prepared BST film.
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Lead zirconate titanate thin films directly on copper electrodes for ferroelectric, dielectric and piezoelectric applications
TL;DR: In this paper, it is shown that it is possible to process lead zirconate (Pb(Zr0.52Ti0.48)O3) thin films directly on base metal copper foils.