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Journal ArticleDOI

Lead zirconate titanate thin films directly on copper electrodes for ferroelectric, dielectric and piezoelectric applications

Angus I. Kingon, +1 more
- 01 Mar 2005 - 
- Vol. 4, Iss: 3, pp 233-237
TLDR
In this paper, it is shown that it is possible to process lead zirconate (Pb(Zr0.52Ti0.48)O3) thin films directly on base metal copper foils.
Abstract
Replacement of noble metal electrodes by base metals significantly lowers the cost of ferroelectric, piezoelectric and dielectric devices. Here, we demonstrate that it is possible to process lead zirconate (Pb(Zr0.52Ti0.48)O3, or PZT) thin films directly on base metal copper foils. We explore the impact of the oxygen partial pressure during processing, and demonstrate that high-quality films and interfaces can be achieved through control of the oxygen partial pressure within a narrow window predicted by thermodynamic stability considerations. This demonstration has broad implications, opening up the possibility of the use of low-cost, high-conductivity copper electrodes for a range of Pb-based perovskite materials, including PZT films in embedded printed circuit board applications for capacitors, varactors and sensors; multilayer PZT piezoelectric stacks; and multilayer dielectric and electrostrictive devices based on lead magnesium niobate–lead titanate. We also point out that the capacitors do not fatigue on repeated switching, unlike those with Pt noble metal electrodes. Instead, they appear to be fatigue-resistant, like capacitors with oxide electrodes. This may have implications for ferroelectric non-volatile memories.

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Citations
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Ferroelectric thin films: Review of materials, properties, and applications

TL;DR: An overview of the state of the art in ferroelectric thin films is presented in this paper, where the authors review applications: micro-systems' applications, applications in high frequency electronics, and memories based on Ferroelectric materials.
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Low loss dielectric materials for LTCC applications: a review

TL;DR: In this paper, the authors present a review of low temperature co-fired ceramic (LTCC) technologies for high frequency applications, which will be of immense help to researchers and technologists all over the world.
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Giant piezoelectricity of monolayer group IV monochalcogenides: SnSe, SnS, GeSe, and GeS

TL;DR: In this paper, the authors predict anisotropic piezoelectric effects in intrinsic monolayer group IV monochalcogenides (MX, M=Sn or Ge, X=Se or S), including SnSe, SnS, GeSe, and GeS.
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A comprehensive review on piezoelectric energy harvesting technology: Materials, mechanisms, and applications

TL;DR: A comprehensive review on the state-of-the-art of piezoelectric energy harvesting is presented, including basic fundamentals and configurations, materials and fabrication, performance enhancement mechanisms, applications, and future outlooks.
References
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Journal ArticleDOI

Polarization fatigue in ferroelectric films: Basic experimental findings, phenomenological scenarios, and microscopic features

TL;DR: In this paper, the role of oxygen vacancy migration and electron injection in the reduction of switchable polarization of ferroelectric thin films due to electrical stress (polarization fatigue) is investigated.
Journal ArticleDOI

Fatigue of ferroelectric PbZrxTiyO3 capacitors with Ru and RuOx electrodes

TL;DR: In this paper, the fatigue behavior of ferroelectric PZT capacitors with Ru and RuOx electrodes was studied, and the initial polarization was lower, but after fatiguing the polarization was comparable to or larger than that for Pt electrodes.
Journal ArticleDOI

Phase Equilibrium in the System PbO‐TiO2–ZrO2

TL;DR: In this article, phase equilibrium relations in the system PbO-TiO2-ZrO2 were studied by quenching in the range where the pbO content is 50 mole % and more.
Journal ArticleDOI

Electrical properties of ferroelectric thin‐film capacitors with hybrid (Pt,RuO2) electrodes for nonvolatile memory applications

TL;DR: In this paper, the Pb(ZrxTi1−x)O3 (PZT) thin-film capacitors are used in ferroelectric nonvolatile memories.
Journal ArticleDOI

Contribution of electrodes and microstructures to the electrical properties of Pb(Zr0.53Ti0.47)O3 thin film capacitors

TL;DR: In this article, it was shown that polarization fatigue is determined largely by the electrode type (Pt vs RuO2), and microstructure has only a second-order effect on fatigue.
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