C
Christopher J. Kiely
Researcher at Lehigh University
Publications - 389
Citations - 33224
Christopher J. Kiely is an academic researcher from Lehigh University. The author has contributed to research in topics: Catalysis & Nanoparticle. The author has an hindex of 84, co-authored 374 publications receiving 29156 citations. Previous affiliations of Christopher J. Kiely include Rice University & University of Liverpool.
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Journal ArticleDOI
Gold‐Nanoparticle‐Based Catalysts for the Oxidative Esterification of 1,4‐Butanediol into Dimethyl Succinate
Gemma Louise Brett,Peter J. Miedziak,Qian He,David W. Knight,Jennifer K. Edwards,Stuart Hamilton Taylor,Christopher J. Kiely,Graham J. Hutchings +7 more
TL;DR: It was determined that small gold-palladium nanoalloys supported on a basic Mg(OH)2 support provided the best catalysts for this reaction, with magnesium hydroxide leading to the highest yield of dimethyl succinate.
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Adoption of near-coincident-site lattice orientations by contacting monolayer rafts of metallic nanoparticles with different superlattice periodicities
TL;DR: In this paper, a hexagonal raft of monodisperse alkane-thiol-stabilized Au nanoparticles has been self-assembled from solution on to an amorphous C substrate and then subsequently a second layer of different sized gold nanoparticles was deposited on top of the first.
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Publisher Correction: Unravelling structure sensitivity in CO 2 hydrogenation over nickel
Charlotte Vogt,Esther Groeneveld,Gerda Kamsma,Maarten Nachtegaal,Li Lu,Christopher J. Kiely,Peter H. Berben,Florian Meirer,Bert M. Weckhuysen +8 more
TL;DR: In the version of this article originally published online, in Fig. 2b, the y axis unit incorrectly included superscript 1 on Ni; it should have been just Ni as discussed by the authors.
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High‐sensitivity plasma‐based sputtered neutral mass spectrometry depth profiling of zinc‐implanted GaAs
TL;DR: A commercial sputtered neutral mass spectrometer, using a rfgenerated plasma for both sputtering and postionization of sputtered particles, has been modified to improve sensitivity for trace analysis as discussed by the authors.