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David J. Foran

Researcher at Rutgers University

Publications -  135
Citations -  4164

David J. Foran is an academic researcher from Rutgers University. The author has contributed to research in topics: Image segmentation & Breast cancer. The author has an hindex of 33, co-authored 132 publications receiving 3464 citations. Previous affiliations of David J. Foran include University of Maryland, College Park & University of Medicine and Dentistry of New Jersey.

Papers
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Journal ArticleDOI

Robust Segmentation of Overlapping Cells in Histopathology Specimens Using Parallel Seed Detection and Repulsive Level Set

TL;DR: This paper proposes a novel algorithm that can reliably separate touching cells in hematoxylin-stained breast TMA specimens that have been acquired using a standard RGB camera and compares the pixel-wise accuracy provided by human experts with that produced by the new automated segmentation algorithm.
Patent

Collaborative diagnostic systems

TL;DR: The systems described in this article include tools for computer-assisted evaluation of objective characteristics of pathologies, along with human decision-making where substantial discretion is involved, and collaborative diagnosis may be provided through shared access to data and shared control over a diagnostic tool.
Journal ArticleDOI

Unsupervised segmentation based on robust estimation and color active contour models

TL;DR: This paper investigates the design, development, and implementation of a robust color gradient vector flow (GVF) active contour model for performing segmentation, using a database of 1791 imaged cells and shows the results were superior to the other unsupervised approaches, and comparable with supervised segmentation.
Proceedings ArticleDOI

Multiple Class Segmentation Using A Unified Framework over Mean-Shift Patches

TL;DR: This paper achieves multiple class object-based segmentation using the appearance and bag of keypoints models integrated over mean-shift patches using a novel affine invariant descriptor to model the spatial relationship of key points and apply the elliptical Fourier descriptor to describe the global shapes.