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Doo-Hyeb Youn

Researcher at Electronics and Telecommunications Research Institute

Publications -  47
Citations -  2145

Doo-Hyeb Youn is an academic researcher from Electronics and Telecommunications Research Institute. The author has contributed to research in topics: Metal–insulator transition & Mott transition. The author has an hindex of 16, co-authored 47 publications receiving 1939 citations. Previous affiliations of Doo-Hyeb Youn include University of Tokushima.

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Mechanism and observation of Mott transition in VO2-based two- and three-terminal devices

TL;DR: When holes of about 0.018% are induced into a conduction band (breakdown of critical on-site Coulomb energy), an abrupt first-order Mott metal-insulator transition (MIT) was observed on an inhomogeneous VO2 film, a strongly correlated Mott insulator.
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Observation of Mott Transition in VO_2 Based Transistors

TL;DR: An abrupt Mott metal-insulator transition (MIT) rather than the continuous Hubbard MIT near a critical on-site Coulomb energy U/U_c=1 was observed for the first time in VO_2, a strongly correlated material, by inducing holes of about 0.018% into the conduction band as mentioned in this paper.
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Raman study of electric-field-induced first-order metal-insulator transition in VO2-based devices

TL;DR: In this article, an abrupt first-order metal-insulator transition (MIT) as a current jump has been observed by applying a dc electric field to Mott insulator VO2-based two-terminal devices.
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Observation of First-Order Metal-Insulator Transition without Structural Phase Transition in VO_2

TL;DR: In this paper, an abrupt first-order metal-insulator transition (MIT) without structural phase transition is first observed by current-voltage measurements and micro-Raman scattering experiments, when a DC electric field is applied to a Mott insulator VO_2 based two-terminal device.
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Flexible and transparent gas molecule sensor integrated with sensing and heating graphene layers.

TL;DR: Large-scale flexible and transparent gas molecule sensor devices, integrated with a graphene sensing channel and a graphene transparent heater for fast recovering operation, are demonstrated, enabling an overall device optical transmittance that exceeds 90% and reliable sensing performance with a bending strain of less than 1.4%.