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Flavio Canavero

Researcher at Polytechnic University of Turin

Publications -  297
Citations -  3826

Flavio Canavero is an academic researcher from Polytechnic University of Turin. The author has contributed to research in topics: Polynomial chaos & Monte Carlo method. The author has an hindex of 28, co-authored 289 publications receiving 3408 citations.

Papers
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Stability, Causality, and Passivity in Electrical Interconnect Models

TL;DR: This paper presents the fundamental properties of causality, stability, and passivity that electrical interconnect models must satisfy in order to be physically consistent and interpret several common situations where either model derivation or model use in a computer-aided design environment fails dramatically.
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Overview of Signal Integrity and EMC Design Technologies on PCB: Fundamentals and Latest Progress

TL;DR: The fundamentals and latest progress of modeling, analysis, and design technologies for signal integrity and electromagnetic compatibility on PCB and package in the past decades are reviewed and the necessity of practical training of designers is mentioned.
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Transient analysis of lossy transmission lines: an efficient approach based on the method of Characteristics

TL;DR: This paper shows that the efficiency of delay extraction techniques is strongly dependent on the particular circuit implementation and several practical issues including generation of rational approximations and time step control are discussed in detail.
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Stochastic Analysis of Multiconductor Cables and Interconnects

TL;DR: In this article, the authors proposed an effective solution for the simulation of cables and interconnects with the inclusion of the effects of parameter uncertainties based on the telegraphers equations with stochastic coefficients, whose solution requires an expansion of the unknown parameters in terms of orthogonal polynomials of random variables.
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M/spl pi/log, macromodeling via parametric identification of logic gates

TL;DR: The paper reviews the basics of the parametric identification approach and illustrates its most recent extensions to handle temperature and supply voltage variations as well as power supply ports and tristate devices.