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Igor Simone Stievano

Researcher at Polytechnic University of Turin

Publications -  168
Citations -  1575

Igor Simone Stievano is an academic researcher from Polytechnic University of Turin. The author has contributed to research in topics: Polynomial chaos & Signal integrity. The author has an hindex of 17, co-authored 160 publications receiving 1417 citations. Previous affiliations of Igor Simone Stievano include University of Turin.

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Stochastic Analysis of Multiconductor Cables and Interconnects

TL;DR: In this article, the authors proposed an effective solution for the simulation of cables and interconnects with the inclusion of the effects of parameter uncertainties based on the telegraphers equations with stochastic coefficients, whose solution requires an expansion of the unknown parameters in terms of orthogonal polynomials of random variables.
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M/spl pi/log, macromodeling via parametric identification of logic gates

TL;DR: The paper reviews the basics of the parametric identification approach and illustrates its most recent extensions to handle temperature and supply voltage variations as well as power supply ports and tristate devices.
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Parameters Variability Effects on Multiconductor Interconnects via Hermite Polynomial Chaos

TL;DR: In this article, an enhanced transmission-line model based on the expansion of the well-known telegraph equations in terms of orthogonal polynomials has been proposed to allow the stochastic analysis of a realistic multiconductor interconnect.
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Parametric macromodels of digital I/O ports

TL;DR: The proposed macromodels consist of parametric representations that can be obtained from port transient waveforms at the device ports via a well established procedure and are implementable as SPICE subcircuits.
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Stochastic transmission line analysis via polynomial chaos methods: an overview

TL;DR: The article briefly reviews virtually all existing methods for the statistical analysis of transmission lines, whilst focusing on the popular and accurate stochastic Galerkin (SG) method as well as on the recent, more efficient and non-intrusive formulation of the so-called Stochastic testing (ST) method.