scispace - formally typeset
F

Frederick Alyious List

Researcher at Oak Ridge National Laboratory

Publications -  54
Citations -  5797

Frederick Alyious List is an academic researcher from Oak Ridge National Laboratory. The author has contributed to research in topics: Texture (crystalline) & Layer (electronics). The author has an hindex of 25, co-authored 53 publications receiving 5078 citations. Previous affiliations of Frederick Alyious List include Martin Marietta Materials, Inc. & University of Tennessee.

Papers
More filters
Journal ArticleDOI

The metallurgy and processing science of metal additive manufacturing

TL;DR: In this article, a review of additive manufacturing (AM) techniques for producing metal parts are explored, with a focus on the science of metal AM: processing defects, heat transfer, solidification, solid-state precipitation, mechanical properties and post-processing metallurgy.
Journal ArticleDOI

High critical current density superconducting tapes by epitaxial deposition of YBa2Cu3Ox thick films on biaxially textured metals

TL;DR: Deposited conductors made using this technique offer a potential route for the fabrication of long lengths of high‐Jc wire capable of carrying high currents in high magnetic fields and at elevated temperatures.
Journal Article

High critical current density superconducting tapes by epitaxial deposition of YBa2Cu3Ox thick films on biaxially textured metals

TL;DR: In this article, a method to obtain long lengths of flexible, biaxially oriented substrates with smooth, chemically compatible surfaces for epitaxial growth of high-temperature superconductors is reported.
Journal ArticleDOI

High-performance high-TC superconducting wires.

TL;DR: Benefits of the critical current in self-field as well as excellent retention of this current in high applied magnetic fields were achieved in the thick films via incorporation of a periodic array of extended columnar defects, composed of self-aligned nanodots of nonsuperconducting material extending through the entire thickness of the film.
Journal ArticleDOI

Growth of biaxially textured buffer layers on rolled-Ni substrates by electron beam evaporation

TL;DR: In this article, two buffer layer architectures were developed on rolled-Ni substrates using an electron beam evaporation technique, one consisting of an epitaxial laminate of CeO 2 /Pd/Ni and the other consisting of a YSZ/CeO 2/Ni.