G
G. Van den bosch
Researcher at Katholieke Universiteit Leuven
Publications - 127
Citations - 1890
G. Van den bosch is an academic researcher from Katholieke Universiteit Leuven. The author has contributed to research in topics: NAND gate & Dielectric. The author has an hindex of 21, co-authored 117 publications receiving 1680 citations. Previous affiliations of G. Van den bosch include IMEC.
Papers
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Hot-carrier degradation phenomena in lateral and vertical DMOS transistors
TL;DR: In this paper, the hot-carrier degradation behavior of both a lateral and a vertical integrated DMOS transistor is investigated by the analysis of the electrical data, charge pumping measurements and two-dimensional device simulations.
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Spectroscopic charge pumping: A new procedure for measuring interface trap distributions on MOS transistors
TL;DR: In this article, an approach to the application of the charge pumping technique is proposed as a tool for the measurement of interface trap energy distributions in small area MOS transistors, where only one energy window is defined, and forced to move through the bandgap by changing the sample temperature.
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Characterization of Total Safe Operating Area of Lateral DMOS Transistors
P. Moens,G. Van den bosch +1 more
TL;DR: In this article, the total safe operating area (SOA) of LDMOS transistors is discussed, and a methodology to build the total SOA for a 40-V LDC is presented.
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Temperature dependence of the channel hot-carrier degradation of n-channel MOSFET's
TL;DR: In this article, the authors investigated the role of hot electrons and hot holes in the generation of fast interface traps by channel hot-carrier injection in n-channel MOS transistors.
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On the geometric component of charge-pumping current in MOSFETs
TL;DR: In this paper, a simple method of unambiguously determining the presence of any geometric component in a charge-pumping measurement by collecting this component at another node via a nearby junction is presented.